2017
DOI: 10.1016/j.spmi.2017.07.059
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Characterisation of temperature dependent parameters of multi-quantum well (MQW) Ti/Au/n-AlGaAs/n-GaAs/n-AlGaAs Schottky diodes

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Cited by 25 publications
(22 citation statements)
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“…3 that, by rising temperature, the current value is also increased. This indicates a usual thermal activation phenomenon [13,16,18] . The obtained experimental (I-V) characteristics were used to extract the main Schottky diode parameters (n, Rs , Is ,Φb).…”
Section: Resultsmentioning
confidence: 84%
See 1 more Smart Citation
“…3 that, by rising temperature, the current value is also increased. This indicates a usual thermal activation phenomenon [13,16,18] . The obtained experimental (I-V) characteristics were used to extract the main Schottky diode parameters (n, Rs , Is ,Φb).…”
Section: Resultsmentioning
confidence: 84%
“…In this work, a Multi-Quantum Wells (MQWs) GaAs/Al0.33Ga0.67As Schottky diode, fabricated at Nottingham University (school of physics and astronomy applied) [16,17] , has been utilized to test the effectiveness of the developed methods.…”
Section: Methodsmentioning
confidence: 99%
“…In this work, sample referenced by NU1054 was fabricated at Nottingham University [7,8]. It is n-type Silicon doped GaAs/AlGaAs multi quantum wells Schottky diode.…”
Section: Methodsmentioning
confidence: 99%
“…The elaboration of this type of microelectronic devices requires different steps, which is called fabrication process, starting from the growth of the substrate, than the deposition of various semiconductors and buffer layers. After that, the metallization phase is achieved by creating Schottky or ohmic contacts [7,8]. Finally, the electrical characterization of the fabricated device is afterward established.…”
Section: Introductionmentioning
confidence: 99%
“…Electrical characterization was considered as an indispensable phase, for instance current-voltage (I-V) and capacitancevoltage (C-V) characteristics were used to extract the main SBD parameters. However, I-V measurements of Schottky diodes at room temperature do not give sufficient information about the conduction mechanism and barrier formation nature at MS interface [12]. Thereby, many researchers have been interested in the investigation of temperature effects on I-V and C-V characteristics by determining the SBD parameters.…”
Section: Introductionmentioning
confidence: 99%