2007
DOI: 10.1049/el:20073130
|View full text |Cite
|
Sign up to set email alerts
|

Characterisation of electromagnetic susceptibility of integrated circuits using near-field scan

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1

Citation Types

0
28
0

Year Published

2008
2008
2024
2024

Publication Types

Select...
6
3
1

Relationship

0
10

Authors

Journals

citations
Cited by 64 publications
(31 citation statements)
references
References 2 publications
0
28
0
Order By: Relevance
“…This measurement consists in injecting electromagnetic disturbances through magnetic loops or electrical dipoles placed very close to the IC area under investigation. This technique has been successfully used for injecting local electrostatic discharges [6], [7], or coupling the IC with a interfering continuous wave [8]. In both cases, the injection probes are specific to the measurement and do not emulate real-case aggressor circuits.…”
Section: Interferences In 3g Mobile Platformmentioning
confidence: 99%
“…This measurement consists in injecting electromagnetic disturbances through magnetic loops or electrical dipoles placed very close to the IC area under investigation. This technique has been successfully used for injecting local electrostatic discharges [6], [7], or coupling the IC with a interfering continuous wave [8]. In both cases, the injection probes are specific to the measurement and do not emulate real-case aggressor circuits.…”
Section: Interferences In 3g Mobile Platformmentioning
confidence: 99%
“…Scientists have researched the immunity of components from different aspects. Some works refer to the immunity measurement of components including direct power injection [1], bulk current injection and near-field scan immunity [2,3]. Several modelling studies have also been used to predict microcontroller immunity, such as the input/output buffer information specification and the neural network method [4].…”
Section: Introductionmentioning
confidence: 99%
“…Many research works [1][2][3][4][5][6][7][8][9][10][11][12][13] have exploited different crystal oscillator circuit architectures, which usually play the important role in improving EMI susceptibility, start-up, drive-level, and negative resistance dynamics of the crystal oscillator circuits. But they are expensive and exhibit inferior phase noise.…”
Section: Introductionmentioning
confidence: 99%