Cepstral scanning transmission electron microscopy imaging of severe lattice distortions

Shao, Yu‐Tsun; Yuan, Renliang; Hsiao, Haw-Wen; Yang, Qun; Hu, Yang; Zuo, Jian‐Min

doi:10.1016/j.ultramic.2021.113252

Cited by 12 publications

(15 citation statements)

References 45 publications

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“…A (G) virtual-image formed from the total diffuse scattering signal integrated over yellow annulus in (F) and an (H) composite virtual-image of the blue, green, and red signals in the dC p showing the complex structural distortions of the HEA. Scale bars in G and H are 40 nm, reproduced from ( Shao et al 2021 ).…”

Section: Linking Real and Reciprocal-space Information With 4d-stemmentioning

confidence: 99%

“…It could also be used to investigate the spatial the origins of diffuse electron scatter (see Diffraction Fine-Structure ) from the specimen, however, this presents several challenges. A more sophisticated approach is achieved by Cepstral STEM ( Shao et al, 2021 ), which is a new 4D-STEM technique for imaging severe lattice distortions within disordered crystals using fluctuations in electron diffuse scatter that arise due to crystal disorder. Cepstral analysis is a sensitive signal processing technique for detecting weak harmonic signals by performing a Cepstral transform of the coherent NBED pattern.…”

Section: Linking Real and Reciprocal-space Information With 4d-stemmentioning

confidence: 99%

“…The Cepstrum transform has been applied previously to ED patterns for lattice strain analysis based on Bragg scatter ( Padgett et al, 2020 ). Recently, the difference Cepstrum (dC p ) was developed, which represents the difference between the Cepstral transforms of local NBED patterns and the region-averaged NBED pattern within a 4D dataset ( Shao et al, 2021 ). The dC p separates electron diffuse scattering from Bragg diffraction so the diffuse signal can be analyzed to determine the distortive part of electron scattering potential.…”

Section: Linking Real and Reciprocal-space Information With 4d-stemmentioning

confidence: 99%

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Probing Multiscale Disorder in Pyrochlore and Related Complex Oxides in the Transmission Electron Microscope: A Review

et al. 2021

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Transmission electron microscopy (TEM), and its counterpart, scanning TEM (STEM), are powerful materials characterization tools capable of probing crystal structure, composition, charge distribution, electronic structure, and bonding down to the atomic scale. Recent (S)TEM instrumentation developments such as electron beam aberration-correction as well as faster and more efficient signal detection systems have given rise to new and more powerful experimental methods, some of which (e.g., 4D-STEM, spectrum-imaging, in situ/operando (S)TEM)) facilitate the capture of high-dimensional datasets that contain spatially-resolved structural, spectroscopic, time- and/or stimulus-dependent information across the sub-angstrom to several micrometer length scale. Thus, through the variety of analysis methods available in the modern (S)TEM and its continual development towards high-dimensional data capture, it is well-suited to the challenge of characterizing isometric mixed-metal oxides such as pyrochlores, fluorites, and other complex oxides that reside on a continuum of chemical and spatial ordering. In this review, we present a suite of imaging and diffraction (S)TEM techniques that are uniquely suited to probe the many types, length-scales, and degrees of disorder in complex oxides, with a focus on disorder common to pyrochlores, fluorites and the expansive library of intermediate structures they may adopt. The application of these techniques to various complex oxides will be reviewed to demonstrate their capabilities and limitations in resolving the continuum of structural and chemical ordering in these systems.

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Section: Linking Real and Reciprocal-space Information With 4d-stemmentioning

confidence: 99%

Section: Linking Real and Reciprocal-space Information With 4d-stemmentioning

confidence: 99%

Section: Linking Real and Reciprocal-space Information With 4d-stemmentioning

confidence: 99%

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Probing Multiscale Disorder in Pyrochlore and Related Complex Oxides in the Transmission Electron Microscope: A Review

et al. 2021

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“…Recently, cepstrum analysis ( * , ( )-+) has been introduced for the study of both ordering and disordering in materials systems. This analytical technique has been applied to study nano-to atomic-scale lattice strain and crystalline defects [7,8].…”

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confidence: 99%

Fluctuation Cepstral STEM for Imaging Disordered Materials

Pidaparthy

Hou

et al. 2022

Microscopy and Microanalysis

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“…The inelastic background, which is incoherent, is filtered out by coherent scattering [1]. To overcome the weak signal issue, we employ pixelated detectors with large dynamic range to capture electron diffuse scattering The harmonic signals in coherent electron diffuse scattering are detected through the difference Cepstral analysis method [2,3], where we subtract the Cepstrum of a region averaged nanodiffraction pattern from that of a local pattern. We show theoretically that this subtraction removes Bragg diffraction from the diffraction pattern and provide Patterson function analysis of diffuse scattering.…”

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confidence: 99%

Cepstral Scanning Transmission Electron Microscopy Imaging of Disordered Crystals using Coherent Diffuse Scattering

et al. 2021

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The development of four-dimensional (4D) scanning transmission electron microscopy (STEM) using fast detectors has opened-up new avenues for imaging defects, which ranges from being relatively simple, like virtual bright-or dark-field imaging, to being sophisticated, such as strain mapping using Bragg diffraction or Kikuchi/HOLZ lines. Here we introduce a new 4D-STEM technique, called Cepstral STEM, for imaging defects in crystals using electron diffuse scattering. In contrast to analysis based on Bragg diffraction, which measures the locally averaged d-spacings, elastic electron diffuse scattering can detect disruptions to the lattice. The disruptions, which gives rise to different types of diffuse scattering, include short range order, dislocations, stacking faults, and lattice distortion from crystal disorder. With the latter defines the atomic displacements from the average lattice sites, which differs from lattice strain that gives the change in local lattice parameters.

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Cepstral scanning transmission electron microscopy imaging of severe lattice distortions

Cited by 12 publications

References 45 publications

Probing Multiscale Disorder in Pyrochlore and Related Complex Oxides in the Transmission Electron Microscope: A Review

Probing Multiscale Disorder in Pyrochlore and Related Complex Oxides in the Transmission Electron Microscope: A Review

Fluctuation Cepstral STEM for Imaging Disordered Materials

Cepstral Scanning Transmission Electron Microscopy Imaging of Disordered Crystals using Coherent Diffuse Scattering

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