CdZnTe position-sensitive drift detectors with thicknesses up to 5 cm

Bolotnikov, A. E.; Camarda, G. S.; Chen, E.; Cheng, Shaobo; Cui, Yonggang; Gul, R.; Gallagher, Ryan; Dědič, V.; Geronimo, G. De; Giraldo, L. Ocampo; Fried, J.; Hossain, Anwar; Mackenzie, J.; Sellin, P.J.; Taherion, Saeid; Vernon, E.; Yang, Ge; El-Hanany, U.; James, R. B.

doi:10.1063/1.4943161

Cited by 31 publications

(11 citation statements)

References 8 publications

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“…Chargeloss correction was not applied to the 1.35% recorded here as well as for the 0.9% resolution reported by Roy et al [32] for CZTS Frisch-grid detectors. As-measured resolution of 2% was reported by Bolotnikov et al [50] for a 6 x 6 x 20 mm 3 CZT Frisch-grid detector. FIGURE 9.…”

Section: B Comrarison Of Czts To Cztsupporting

confidence: 60%

Optimizing CdZnTeSe Frisch-Grid Nuclear Detector for Gamma-Ray Spectroscopy

et al. 2020

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Wide bandgap semiconductor materials capable of detecting X-rays and gamma-rays at room temperature without cryogenic cooling have great advantages that include portability and wide-area deployment in nuclear and radiological threat defense. Additional major applications include medical imaging, spectroscopy, and astrophysics. Most current room-temperature ionizing radiation detector devices are fabricated from cadmium telluride (CdTe) and cadmium zinc telluride (CdZnTe). Cadmium zinc telluride selenide (CdZnTeSe or CZTS) can be grown with high crystal yield compared to CdTe and CdZnTe. Thus, CZTS has the advantage of lowering the cost of room-temperature nuclear detectors. Thick CdTe-based detectors are prone to the trapping of charge carriers, thus limiting energy resolution and efficiency. A Frisch-Grid configuration helps to solve this problem. This research is focused on optimizing the Frisch-grid configuration for a CZTS detector. The CZTS was grown by traveling heater method. Infrared images of the CZTS matrix largely showed the absence of tellurium inclusions. The resistivity of the CZTS obtained from a current-voltage plot is of the order of 10 10 Ω.cm. The charge-transport characterized by measuring the electron mobility-lifetime product is 4.7 x 10-3 cm 2 /V. Detector resolution was measured for various Frischring widths. For a 4.8 x 4.9 x 9.7 mm 3 detector, the best Frisch-ring widths were found to be 3-4 mm. A detector resolution of 1.35% full-width-at-half-maximum was obtained for the 3-mm width at-2300 V bias voltage for the 662-keV gamma peak of 137 Cs. A resolution of 1.36% was obtained for the 4-mm width at-1800 V applied bias. INDEX TERMS CdZnTeSe detectors, detector resolution, Frisch-grid, gamma-ray detector, nuclear radiation detector, traveling heater method, X-ray detector.

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Section: B Comrarison Of Czts To Cztsupporting

confidence: 60%

Optimizing CdZnTeSe Frisch-Grid Nuclear Detector for Gamma-Ray Spectroscopy

et al. 2020

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“…It is a standard and widely-used method [11,12,13,14,15,16,17], which allows us to study samples under various excitation conditions. It is based on the collimated monochromatic low intensity light beam (1550 nm, ∼0.8 eV) passing through the biased sample (by high voltage supply ISEG SHQ 122M) placed between two orthogonal linear polarizers (Figure 1a).…”

Section: Methodsmentioning

confidence: 99%

Infrared LED Enhanced Spectroscopic CdZnTe Detector Working under High Fluxes of X-rays

Pekárek

Dědič

Franc

et al. 2016

Sensors

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This paper describes an application of infrared light-induced de-polarization applied on a polarized CdZnTe detector working under high radiation fluxes. We newly demonstrate the influence of a high flux of X-rays and simultaneous 1200-nm LED illumination on the spectroscopic properties of a CdZnTe detector. CdZnTe detectors operating under high radiation fluxes usually suffer from the polarization effect, which occurs due to a screening of the internal electric field by a positive space charge caused by photogenerated holes trapped at a deep level. Polarization results in the degradation of detector charge collection efficiency. We studied the spectroscopic behavior of CdZnTe under various X-ray fluxes ranging between 5×105 and 8×106 photons per mm2 per second. It was observed that polarization occurs at an X-ray flux higher than 3×106 mm−2·s−1. Using simultaneous illumination of the detector by a de-polarizing LED at 1200 nm, it was possible to recover X-ray spectra originally deformed by the polarization effect.

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“…They are invisible in an IR transmission mode, but they are detectable by charge collection and etch-pit density measurements. Depending on their concentration and size, these star-like defects can severely hamper the charge-transport properties [16] and the device performance [17]. Thus, producing material with reduced or even zero sub-grain boundaries is expected to increase the performance and yield of high-quality detectors.…”

Section: Introductionmentioning

confidence: 99%

X-ray topographic study of Bridgman-grown CdZnTeSe

Roy

Camarda

Cui

et al. 2020

Journal of Crystal Growth

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We have characterized the structural quality of Cd0.9Zn0.1Te0.93Se0.07 ingot grown by the vertical Bridgman growth technique. The structural quality of Cd0.9Zn0.1Te0.93Se0.07 ingot along the length was investigated via X-ray topography in the reflection mode using a white beam synchrotron radiation source. The X-ray topography data revealed the presence of very few sub grain boundaries and no sub-grain boundary network for the CdZnTeSe samples used in this study.

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CdZnTe position-sensitive drift detectors with thicknesses up to 5 cm

Cited by 31 publications

References 8 publications

Optimizing CdZnTeSe Frisch-Grid Nuclear Detector for Gamma-Ray Spectroscopy

Optimizing CdZnTeSe Frisch-Grid Nuclear Detector for Gamma-Ray Spectroscopy

Infrared LED Enhanced Spectroscopic CdZnTe Detector Working under High Fluxes of X-rays

X-ray topographic study of Bridgman-grown CdZnTeSe

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