X-ray topographic study of Bridgman-grown CdZnTeSe

Roy, Utpal; Camarda, G. S.; Cui, Yonggang; James, R. B.

doi:10.1016/j.jcrysgro.2020.125753

Cited by 9 publications

(4 citation statements)

References 28 publications

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“…The defect densities, sub-grain boundary network, residual stress, surface disorder, and presence of Te inclusions near the sample surface can have significant contribution towards broadening of the XRD peak. It is to be noted that, qualitatively, we did not observe the presence of considerable residual stress in any of our CZTS samples with selenium concentrations ranging from 2-7%, as characterized by X-ray topography and infrared (IR) transmission investigation through crossed polarizers [19][20][21]26,31,32 . The ingots were also found to be stress free, and no lattice distortion was observed near the periphery of the wafer touching the ampoule wall 19,32 .…”

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confidence: 53%

“…It is to be noted that, qualitatively, we did not observe the presence of considerable residual stress in any of our CZTS samples with selenium concentrations ranging from 2-7%, as characterized by X-ray topography and infrared (IR) transmission investigation through crossed polarizers [19][20][21]26,31,32 . The ingots were also found to be stress free, and no lattice distortion was observed near the periphery of the wafer touching the ampoule wall 19,32 . The CZTS samples were free from sub-grain boundary networks and observed to contain a very low amount of Te inclusions compared to typical CZT.…”

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confidence: 53%

“…Chang et al 30 reported uniform composition for Cd0.96Zn0.04Te0.84Se0.16 ingots grown by the vertical Bridgman technique. The new quaternary material is reported to be free from subgrain boundary networks [31][32][33] as Se acts as an effective lattice hardening agent in CZTS matrix. The sub-grain boundary network is known to be the major performance-limiting defect in CZT material 12 .…”

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confidence: 99%

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Evaluation of crystalline quality of traveling heater method (THM) grown Cd0.9Zn0.1Te0.98Se0.02 crystals

Roy

Baker

Camarda

et al. 2022

Applied Physics Letters

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Because of its excellent opto-electronic properties, CdZnTe (CZT) has been the material of choice for x- and gamma-ray detectors operable at room temperature. CZT is the leading commercially available room-temperature radiation detector material today. Although much progress has been made over the past three decades, today's CZT crystals still face certain challenges, especially the presence of the performance-limiting materials defects and the associated relatively high production cost. In this regard, CdxZn1−xTeySe1−y (CZTS) is emerging as a next-generation compound semiconductor, which overcomes some of the limitations of CZT technology for the stated applications. Here, we conducted a study to evaluate the crystalline quality of the traveling heater method grown CZTS with an optimized alloy composition, i.e., Cd0.9Zn0.1Te0.98Se0.02. The as-grown samples were evaluated by low-temperature photoluminescence (PL) spectroscopy and high-resolution x-ray diffraction using the synchrotron light source at Brookhaven National Laboratory. The full width at half maximum of both the PL and x-ray rocking curves was observed to be broadened due to the lattice disorder of the quaternary compound, eventually degrading the crystalline quality. This was consistent with density functional theory calculations.

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Evaluation of crystalline quality of traveling heater method (THM) grown Cd0.9Zn0.1Te0.98Se0.02 crystals

Roy

Baker

Camarda

et al. 2022

Applied Physics Letters

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“…According to previous research on (Cd,Zn)Te and (Cd,Zn)(Te,Se) [ 8 , 47 ], the presence of selenium plays a crucial role in inhibiting the development of sub-grain boundary networks and increases the hardness of the quaternary material (Cd,Zn)(Te,Se). Additionally, selenium significantly reduces the concentration of tellurium inclusions [ 46 ].…”

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Bridgman-Grown (Cd,Mn)Te and (Cd,Mn)(Te,Se): A Comparison of Suitability for X and Gamma Detectors

Masłowska,

Kochanowska,

Sulich

et al. 2024

Sensors

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This study explores the suitability of (Cd,Mn)Te and (Cd,Mn)(Te,Se) as room-temperature X-ray and gamma-ray detector materials, grown using the Bridgman method. The investigation compares their crystal structure, mechanical and optical properties, and radiation detection capabilities. Both crystals can yield large-area single crystal samples measuring approximately 30 × 30 mm2. In low-temperature photoluminescence analysis, both materials showed defect states, and annealing in cadmium vapors effectively eliminated donor–acceptor pair luminescence in (Cd,Mn)Te but not in (Cd,Mn)(Te,Se). Moreover, harder (Cd,Mn)(Te,Se) exhibited a higher etch pit density compared to softer (Cd,Mn)Te. X-ray diffraction examination revealed uniform lattice constant distribution in both compounds, with variations at a part per million level. (Cd,Mn)Te crystals demonstrated excellent single crystal properties with narrower omega scan widths, while (Cd,Mn)(Te,Se) exhibited a high contribution of block-like structures with significantly larger misorientation angles. Spectroscopic evaluations revealed better performance of a pixelated (Cd,Mn)Te detector, in comparison to (Cd,Mn)(Te,Se), achieving a mean full width at half maximum of 14% for the 122 keV gamma peak of Co-57. The reduced performance of the (Cd,Mn)(Te,Se) detector may be attributed to deep trap-related luminescence or block-like structures with larger misorientation angles. In conclusion, Bridgman-grown (Cd,Mn)Te emerges as a more promising material for X-ray and gamma-ray detectors when compared to (Cd,Mn)(Te,Se).

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CdZnTeSe: A Promising Material for Radiation Detector Applications

Roy

James

2021

Advanced Materials for Radiation Detection

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X-ray topographic study of Bridgman-grown CdZnTeSe

Cited by 9 publications

References 28 publications

Evaluation of crystalline quality of traveling heater method (THM) grown Cd0.9Zn0.1Te0.98Se0.02 crystals

Evaluation of crystalline quality of traveling heater method (THM) grown Cd0.9Zn0.1Te0.98Se0.02 crystals

Bridgman-Grown (Cd,Mn)Te and (Cd,Mn)(Te,Se): A Comparison of Suitability for X and Gamma Detectors

CdZnTeSe: A Promising Material for Radiation Detector Applications

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