As the performance of the front interface and the CdTe absorber are improved, minority carrier recombination at the back of the device will limit the photoconversion efficiency. To determine the limits of performance, we have completed simulations to understand the loss mechanisms, the band bending, and the energetics at the interface between the absorber and the back contact buffer layer. In particular, we have explored how the conduction and valence band offsets, the doping levels in the back buffer and CdTe layers, and the back surface recombination velocity affect the device performance. These results provide guidance for the development of back contacts that will help push CdTe device efficiencies to 25% and beyond.