Cavity perturbation technique for complex permittivity measurement of dielectric materials at X-band microwave frequency

Vyas, Anil; Rana, V. A.; Gadani, Deepak H.; Prajapati, A.N.

doi:10.1109/amta.2008.4763128

Cited by 11 publications

(7 citation statements)

References 2 publications

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“…As expected, the loss is reduced by increasing slot depth. This is because eff dictates the loss in (17).…”

Section: B Comparison Of Slr Process On Cpw-ap and Fem Em Simulationsmentioning

confidence: 99%

“…Another well-known dielectric characterization technique is based on the behavior of resonant cavities. In these techniques, both the permittivity and loss tangent can be accurately extracted by measuring the behavior of the resonator at its resonance frequencies [16], [17], [18]. However, this technique also has limitations, including: (a) the samples to be characterized require a specific shape and dimension to allow insertion in the resonator and accurate measurements and additive manufacturing techniques often are unable to achieve the required dimensions [16].…”

Section: Introductionmentioning

confidence: 99%

“…However, this technique also has limitations, including: (a) the samples to be characterized require a specific shape and dimension to allow insertion in the resonator and accurate measurements and additive manufacturing techniques often are unable to achieve the required dimensions [16]. (b) The extraction technique is only accurate for a range of permittivities and loss tangent values, often for the low-loss (tan δ < 0.01) and low permittivity ( r < 20) [17], or otherwise the resonator behavior does not yield accurate results. (c) The material parameters are extracted at discrete frequencies [18].…”

Section: Introductionmentioning

confidence: 99%

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A Conformal Mapping-Based Broadband Method to Extract Propagation Properties of Dielectrics Using Coplanar Waveguides With Air Pockets

Rojas-Nastrucci

2023

IEEE J. Microw.

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In recent years, advances in material science for high-frequency electronics have generated novel materials that offer superior performance. Additive manufacturing (AM) has expanded the frontiers of microwave material manufacturing going beyond flat geometries and unique properties such as graded permittivity materials. Accurate electromagnetic (EM) material characterization for AM materials remains challenging given the printing volume constraints for manufacturing processes, as traditional EM property extraction techniques often require electrically large samples. Furthermore, loss extraction techniques typically cannot differentiate dielectric and conductor losses in waveguides. This paper presents a novel conformal mapping-based characterization technique using coplanar waveguides (CPW) with air pockets that allows for dielectric permittivity and dielectric loss extraction. The underlying principle of the techniques is to use a set of CPWs with different air slot depths to extract the loss behavior as a function of the slot depth. A new loss-slot rate metric is introduced to decouple the dielectric and conductor losses in the structure. The theoretical foundation of the technique is used to develop a physical-mathematical model for dielectric property extraction that is verified with simulations and experiments for materials with permittivity in the range 2.33-29, and loss tangents of 0.02-0.055. The average error for the equivalent capacitance of the CPW with air pockets (CPW-AP) between the presented model and simulated or measured data is 2.4% for all the studied cases. The experimental confirmation is performed with traditionally manufactured FR-4 and additively manufactured yttria-stabilized zirconia (YSZ) dielectrics up to 10 GHz.

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“…As expected, the loss is reduced by increasing slot depth. This is because eff dictates the loss in (17).…”

Section: B Comparison Of Slr Process On Cpw-ap and Fem Em Simulationsmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

A Conformal Mapping-Based Broadband Method to Extract Propagation Properties of Dielectrics Using Coplanar Waveguides With Air Pockets

Rojas-Nastrucci

2023

IEEE J. Microw.

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“…The determination of the dielectric properties of these films is thus of significant importance. There are well known methods for determining the dielectric properties of low-loss ultra-thin films, such as the use of slotted cavities, closed and open cavity resonator techniques [1][2][3][4]. It is a challenge to find methods that are applicable and sensitive enough for the use on ultra-thin materials at millimeter and terahertz frequencies.…”

Section: Introductionmentioning

confidence: 99%

Complex permittivity of thin films at millimeter and THz frequencies

Liu

Afsar

2011

2011 International Conference on Infrared, Millimeter, and Terahertz Waves

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The measurement of complex dielectric permittivity of thin films are very difficult at millimeter and THz frequencies because the phase shift is not large enough to determine the real part of dielectric permittivity. To overcome this difficulty, dispersive Fourier transform spectroscopy is improved for the first time to have the mirror movement of 0.5 micrometer step size to characterize the permittivity of ultra low-loss thin films.

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“…Assumindo que Es = E0, é possível, novamente, simplificar a equação B.14 e separar as partes real e imaginária nas equações B.15 e B.16 (VYAS et al, 2008) (VENKATESH, 1996NELSON, 1992) (KOMAROV et al, 2005). …”

Section: Apêndice B -Teoria Da Perturbação Ressonanteunclassified

Desenvolvimento de sensores em frequências de micro-ondas para caracterização de etanol combustível.

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Cavity perturbation technique for complex permittivity measurement of dielectric materials at X-band microwave frequency

Cited by 11 publications

References 2 publications

A Conformal Mapping-Based Broadband Method to Extract Propagation Properties of Dielectrics Using Coplanar Waveguides With Air Pockets

A Conformal Mapping-Based Broadband Method to Extract Propagation Properties of Dielectrics Using Coplanar Waveguides With Air Pockets

Complex permittivity of thin films at millimeter and THz frequencies

Desenvolvimento de sensores em frequências de micro-ondas para caracterização de etanol combustível.

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