2018
DOI: 10.1016/j.wear.2017.11.014
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Case study: Wear mechanisms of NiCrVMo-steel and CrB-steel scrap shear blades

Abstract: Shear blades are extensively used in the recycling of metal scrap. A comparative study was conducted on used medium carbon NiCrVMo and CrB containing steel scrap shear blades to better understand their wear mechanisms under service conditions. The microstructure and hardness of worn cutting edges and bulk material were characterised by optical microscopy, scanning electron microscopy and microanalysis, X-ray diffraction analysis and macro/micro hardness testing. Moreover, tensile and Charpy impact properties w… Show more

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Cited by 19 publications
(31 citation statements)
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“…Therefore, SEM images in BSE mode provide a convenient tool to characterize the distribution of secondary phases, the presence of oxides, or other compounds [25,29]. In addition, BSE imaging can also be employed to detect cracks and metallurgical defects, such as porosity and non-metallic inclusions [30].…”
Section: Analytical Scanning Electron Microscopymentioning
confidence: 99%
See 4 more Smart Citations
“…Therefore, SEM images in BSE mode provide a convenient tool to characterize the distribution of secondary phases, the presence of oxides, or other compounds [25,29]. In addition, BSE imaging can also be employed to detect cracks and metallurgical defects, such as porosity and non-metallic inclusions [30].…”
Section: Analytical Scanning Electron Microscopymentioning
confidence: 99%
“…If the analysis is paid more attention on one or more elements in an imaged area, the line-scan mode is operated by confining the scanning electron beam in a defined length, e.g., across a grain boundary or an object of interest, to get the relative (qualitative) profiles of the selected elements. Similarly, the scanning can be made in a pre-defined area, instead of a period of length, to obtain a two-dimensional relative distribution of the featured elements, which is known as element-mapping analysis [30].…”
Section: Analytical Scanning Electron Microscopymentioning
confidence: 99%
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