Infrared Technology and Applications XLIV 2018
DOI: 10.1117/12.2305431
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Carrier concentration and transport in Be-doped InAsSb for infrared sensing applications

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Cited by 3 publications
(5 citation statements)
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“…Fortunately, it is not the case for T < 30 K and T > 200 K, therefore in the following we concentrate on the results obtained at low (region I) and high (region IV) temperatures. Judging from the partial concentrations and mobilities, H1 spectrum is associated with heavy holes, whereas H2 peaks originate from the presence of light holes, in agreement with the recent results of Casias et al [28] for very similar 2-µm-thick InAs0.91Sb0.09 layer, acceptor doped at 3 × 10 18 cm -3 obtained at T = 300 K. However, it is not clear what is the origin of the strong splitting of heavy hole spectra, observed at low temperatures, which gradually disappears when peaks broaden and start to overlap.…”
Section: Resultssupporting
confidence: 91%
See 1 more Smart Citation
“…Fortunately, it is not the case for T < 30 K and T > 200 K, therefore in the following we concentrate on the results obtained at low (region I) and high (region IV) temperatures. Judging from the partial concentrations and mobilities, H1 spectrum is associated with heavy holes, whereas H2 peaks originate from the presence of light holes, in agreement with the recent results of Casias et al [28] for very similar 2-µm-thick InAs0.91Sb0.09 layer, acceptor doped at 3 × 10 18 cm -3 obtained at T = 300 K. However, it is not clear what is the origin of the strong splitting of heavy hole spectra, observed at low temperatures, which gradually disappears when peaks broaden and start to overlap.…”
Section: Resultssupporting
confidence: 91%
“…Namely, Ea = -14 meV in the first layer and Ea = -8 meV in the second one, counted from the top of the heavy hole band. These values are different from the literature data of Ea ≈ 20 meV [28]. However it is well known that as the dopant concentration increases, the dopants start to interact and form an impurity band [33][34][35].…”
Section: Model and Comparison With Experimentscontrasting
confidence: 77%
“…Moreover, it has been well known from the beginning of the 1970s [ 69 , 70 ] that narrow gap III–V semiconductors, especially InAs, creates surface electron accumulation layers. For example, Figure 11 presents band edges of p-type InAs [ 69 ] and InAsSb [ 71 ] with surface electron accumulation. There is strong electron accumulation on the InAsSb side of InAsSb/GaSb heterojunction due to the staggered type II band alignment.…”
Section: Inassb Alloy Propertiesmentioning
confidence: 99%
“…A popular two-layer model has been often used to separate the surface accumulation and epilayer properties. Another approach is applied in the case of more complicated structures like that shown in Figure 11 b. Mobility spectrum analysis and/or variable temperature and magnetic field-dependent transport analysis with multicarrier fitting models have been applied to segregate the epilayer and surface and interface layer characteristics [ 71 ].…”
Section: Inassb Alloy Propertiesmentioning
confidence: 99%
“…Temperature dependent p-doping data from InAs and InAsSb are scarce in general, and to our knowledge, nonexistent for the low-doping regime. Recently Casias et al [9] studied Be-doped InAsSb, but for the GaSb-lattice matched concentration of 9% and at very high dopant concentration levels (~2 × 10 18 cm −3 ).…”
Section: Introductionmentioning
confidence: 99%