2013
DOI: 10.1179/1743289812y.0000000046
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Carbon fibre reinforced polypropylene composites with plasma treated constituent materials

Abstract: In this study, polypropylene (PP) powder and short carbon fibres (CFs) were subjected to oxygen plasma treatment (OPT) and subsequently used to fabricate injection moulded CF reinforced polypropylene composites (CFRPP) with 10 wt-% fibre content. Evidence from various experiments showed the effectiveness of the OPT method in enhancing the wettability and adhesion characteristics of PP and CF. The tensile modulus of CFRPP composites with the OPT was 4700 MPa as compared with a value of 3000 MPa for untreated sa… Show more

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Cited by 12 publications
(28 citation statements)
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“…X‐ray photoelectron spectroscopy (XPS) is widely used to analyze the powder's atomic surface composition and enables the identification of introduced functional groups . Fourier‐transform infrared spectroscopy (FTIR) and attenuated total reflectance infrared spectroscopy (ATR‐IR) are used to probe samples up to a depth of about 4–5 μm . Time of flight secondary ion mass spectroscopy (TOF‐SIMS) is utilized to evaluate the uniformity of plasma‐deposited polymer coatings by detecting sputtered ions and fragments.…”
Section: Analytical Methods For Characterization Of Plasma‐treated Pomentioning
confidence: 99%
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“…X‐ray photoelectron spectroscopy (XPS) is widely used to analyze the powder's atomic surface composition and enables the identification of introduced functional groups . Fourier‐transform infrared spectroscopy (FTIR) and attenuated total reflectance infrared spectroscopy (ATR‐IR) are used to probe samples up to a depth of about 4–5 μm . Time of flight secondary ion mass spectroscopy (TOF‐SIMS) is utilized to evaluate the uniformity of plasma‐deposited polymer coatings by detecting sputtered ions and fragments.…”
Section: Analytical Methods For Characterization Of Plasma‐treated Pomentioning
confidence: 99%
“…Time of flight secondary ion mass spectroscopy (TOF‐SIMS) is utilized to evaluate the uniformity of plasma‐deposited polymer coatings by detecting sputtered ions and fragments. Scanning electron microscopy (SEM) is used to analyze the surface morphology of the particles and coating effects. Atomic force microscopy (AFM) enables the quantification of the surface roughness on the surface.…”
Section: Analytical Methods For Characterization Of Plasma‐treated Pomentioning
confidence: 99%
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