Capabilities of time-resolved X-ray excited optical luminescence of the Taiwan Photon Source 23A X-ray nanoprobe beamline

Lin, Bi Hsuan; Wu, Yu; Li, Xiao Yun; Hsu, Hsu Cheng; Chiu, Yu‐Cheng; Lee, Chien Yu; Chen, Bo Yi; Yin, Gung Chian; Tseng, Shao-Chin; Chang, Shih Hung; Tang, Mau Tsu; Hsieh, Wen‐Pin

doi:10.1107/s1600577519013675

Cited by 21 publications

(14 citation statements)

References 20 publications

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“…The measurements of Fig. 1(b) were conducted in TPS 23A1, in which the beam was focused with a pair of nested Montel mirrors (Yin et al, 2016;Chen et al, 2018;Lee et al, 2018;Lin et al, 2019Lin et al, , 2020. During the experiment, the photon energy was 6 keV, and beam sizes at the focal plane were approximately 100 nm Â 200 nm in the horizontal and vertical directions, respectively, while the distance between the sample and detector was 1 m (the detector used here was from the Eiger 1M series, with a pixel size of 75 mm Â 75 mm, manufactured by DECTRIS Ltd).…”

Section: Experiments and Resultsmentioning

confidence: 99%

Hard X-ray ptychography at Taiwan Photon Source at 11–20 nm spatial resolution

Tsai

Lin

Chen

et al. 2021

J Synchrotron Radiat

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X-ray ptychography, a technique based on scanning and processing of coherent diffraction patterns, is a non-destructive imaging technique with a high spatial resolution far beyond the focused beam size. Earlier demonstrations of hard X-ray ptychography at Taiwan Photon Source (TPS) using an in-house program successfully recorded the ptychographic diffraction patterns from a gold-made Siemens star as a test sample and retrieved the finest inner features of 25 nm. Ptychography was performed at two beamlines with different focusing optics: a pair of Kirkpatrick–Baez mirrors and a pair of nested Montel mirrors, for which the beam sizes on the focal planes were 3 µm and 200 nm and the photon energies were from 5.1 keV to 9 keV. The retrieved spatial resolutions are 20 nm to 11 nm determined by the 10–90% line-cut method and half-bit threshold of Fourier shell correlation. This article describes the experimental conditions and compensation methods, including position correction, mixture state-of-probe, and probe extension methods, of the aforementioned experiments. The discussions will highlight the criteria of ptychographic experiments at TPS as well as the opportunity to characterize beamlines by measuring factors such as the drift or instability of beams or stages and the coherence of beams. Besides, probe functions, the full complex fields illuminated on samples, can be recovered simultaneously using ptychography. Theoretically, the wavefield at any arbitrary position can be estimated from one recovered probe function undergoing wave-propagating. The verification of probe-propagating has been carried out by comparing the probe functions obtained by ptychography and undergoing wave-propagating located at 0, 500 and 1000 µm relative to the focal plane.

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Section: Experiments and Resultsmentioning

confidence: 99%

Hard X-ray ptychography at Taiwan Photon Source at 11–20 nm spatial resolution

Tsai

Lin

Chen

et al. 2021

J Synchrotron Radiat

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“…The XAS, XRF and XEOL experiments were conducted on the Taiwan Photon Source (TPS) 23A X-ray nanoprobe beamline located at the National Synchrotron Radiation Research Center (NSRRC) in Taiwan. The capabilities of the TPS 23A X-ray nanoprobe beamline have previously been described in detail by Lin et al (2019Lin et al ( , 2020. This beamline can deliver an X-ray beam spot size of less than 60 nm.…”

Section: Methodsmentioning

confidence: 99%

Visualizing the valence states of europium ions in Eu-doped BaAl₂O₄ using X-ray nanoprobe mapping

Lin

Chen

et al. 2022

J Synchrotron Radiat

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This study develops and successfully demonstrates visualization methods for the characterization of europium (Eu)-doped BaAl2O4 phosphors using X-ray nanoprobe techniques. X-ray fluorescence (XRF) mapping not only gives information on the elemental distributions but also clearly reveals the valence state distributions of the Eu2+ and Eu3+ ions. The accuracy of the estimated valence state distributions was examined by performing X-ray absorption spectroscopy (XAS) across the Eu L 3-edge (6.977 keV). The X-ray excited optical luminescence (XEOL) spectra exhibit different emission lines in the selected local areas. Their corresponding emission distributions can be obtained via XEOL mapping. The emission properties can be understood through correlation analysis. The results demonstrate that the main contribution to the luminescence intensity of the Eu-doped BaAl2O4 comes from the Eu2+ activator and the emission intensity will not be influenced by the concentration of Eu2+ or Eu3+ ions. It is anticipated that X-ray nanoprobes will open new avenues with significant characterization ability for unravelling the emission mechanisms of phosphor materials.

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“…Despite the common concepts shared with TRCL, the TRXEOL microscopy offers several advantages: (i) larger penetration depths; (ii) no need to operate under vacuum, which limits in situ sample environments, or the need of challenging sample preparation that can even modify the intrinsic sample properties; (iii) multimodal capabilities that enable the correlation of the optical properties (via XEOL) with compositional analysis [(X-ray fluorescence (XRF)] at the nanoscale; (iv) superior detection limits (below ppm levels); (v) chemical site selectivity; (vi) tunable pulsed structure; and (vii) orientational effects by polarization selection rules. In this context, a recent TRXEOL system has been further developed in the hard X-ray nanoprobe 23A of the Taiwan Photon Source . At macroscopic length scales, conventional XEOL layouts can be found in the Canadian Light Source, the Advanced Photon Source, the Cornell High Energy Synchrotron Source and the Diamond Light Source. − …”

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“…Figure a shows a schematic of the setup: the X-ray nanobeam impinges on the sample, which emits light (XEOL) and XRF photons. Further details about the experimental setup, sample structure, as well as a comparison with similar techniques [PL or CL] can be found in the Supporting Information. , So far, there are just a few X-ray nanoprobes worldwide to probe carrier dynamics with high spatial, spectral, and temporal resolutions. , Lin et al have successfully developed recently a TRXEOL system with a 60 nm spot size and 30 ps time resolution at the Taiwan Photon Source . As a proof of concept, here we have examined hexagonal n-GaN/In x Ga 1– x N/n-GaN wires.…”

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“…In this context, a recent TRXEOL system has been further developed in the hard X-ray nanoprobe 23A of the Taiwan Photon Source. 27 At macroscopic length scales, conventional XEOL layouts can be found in the Canadian Light Source, the Advanced Photon Source, the Cornell High Energy Synchrotron Source and the Diamond Light Source. 28−30 Figure 1a shows a schematic of the setup: the X-ray nanobeam impinges on the sample, which emits light (XEOL) and XRF photons.…”

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Spatially and Time-Resolved Carrier Dynamics in Core–Shell InGaN/GaN Multiple-Quantum Wells on GaN Wire

et al. 2021

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Time-resolved cathodoluminescence is a key tool with high temporal and spatial resolution. However, optical spectroscopic information can be also extracted using synchrotron pulses in a hard X-ray nanoprobe, exploiting a phenomenon called X-ray excited optical luminescence. Here, with 20 ps time resolution and 80 nm lateral resolution, we applied this timeresolved X-ray microscopy technique to individual core−shell InGaN/GaN multiple quantum well heterostructures deposited on GaN wires. Our findings suggest that the m-plane related multiple quantum well states govern the carrier dynamics. Likewise, our observations support not only the influence of In incorporation in the recombination rates, but also carrier localization phenomena at the hexagon wire apex. In addition, our experiment calls for further investigations of the spatiotemporal domain on the underlying mechanisms of optoelectronic nanodevices. Its great potential becomes more valuable when time-resolved X-ray excited optical luminescence microscopy is used in operando with other methods, such as X-ray absorption spectroscopy.

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Capabilities of time-resolved X-ray excited optical luminescence of the Taiwan Photon Source 23A X-ray nanoprobe beamline

Cited by 21 publications

References 20 publications

Hard X-ray ptychography at Taiwan Photon Source at 11–20 nm spatial resolution

Hard X-ray ptychography at Taiwan Photon Source at 11–20 nm spatial resolution

Visualizing the valence states of europium ions in Eu-doped BaAl₂O₄ using X-ray nanoprobe mapping

Spatially and Time-Resolved Carrier Dynamics in Core–Shell InGaN/GaN Multiple-Quantum Wells on GaN Wire

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Capabilities of time-resolved X-ray excited optical luminescence of the Taiwan Photon Source 23A X-ray nanoprobe beamline

Cited by 21 publications

References 20 publications

Hard X-ray ptychography at Taiwan Photon Source at 11–20 nm spatial resolution

Hard X-ray ptychography at Taiwan Photon Source at 11–20 nm spatial resolution

Visualizing the valence states of europium ions in Eu-doped BaAl2O4 using X-ray nanoprobe mapping

Spatially and Time-Resolved Carrier Dynamics in Core–Shell InGaN/GaN Multiple-Quantum Wells on GaN Wire

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Visualizing the valence states of europium ions in Eu-doped BaAl₂O₄ using X-ray nanoprobe mapping