2008
DOI: 10.1364/oe.16.008704
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Calibration of the second-order nonlinear optical susceptibility of surface and bulk of glass

Abstract: A two-beam second-harmonic generation technique is developed to calibrate the magnitude of the second-order nonlinear optical susceptibility components of surface and bulk (multipolar origin) of isotropic materials. The values obtained for fused silica calibrated against ChiXXX of crystalline quartz are chi parallel parallel perpendicular = 7.9(4), chi perpendicular parallel parallel (+)gamma = 3.8(4), parallel perpendicular perpendicular perpendicular(+)gamma = 59(4), and delta' = 7.8(4) in units of 10(-22) m… Show more

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Cited by 32 publications
(17 citation statements)
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“…The strong THz emission amplitude from the metamaterial is on the same order as optimal ZnTe crystals that are thousands of times thicker, revealing a gigantic resonant second-order sheet nonlinear susceptibility of SRRs B10 À 16 m 2 V À 1 , which is three orders of magnitude higher than the typical surface and sheet values of bulk crystals and thin films [31][32][33] .…”
mentioning
confidence: 94%
“…The strong THz emission amplitude from the metamaterial is on the same order as optimal ZnTe crystals that are thousands of times thicker, revealing a gigantic resonant second-order sheet nonlinear susceptibility of SRRs B10 À 16 m 2 V À 1 , which is three orders of magnitude higher than the typical surface and sheet values of bulk crystals and thin films [31][32][33] .…”
mentioning
confidence: 94%
“…The expansion coefficients f p , g p , and h s have been previously shown to be linear combinations of the non-vanishing SHG susceptibility tensor components which, for samples of C ∞v symmetry, are χ xxz χ xzx χ yyz χ yzy , χ zxx χ zyy , and χ zzz [22], where z is the sample normal and x, y are the two orthogonal in-plane directions [23]. However, it was recently discovered that in order to properly characterize a film with thickness much smaller than the spot size of the fundamental beam, effects arising from multiple reflections within the films can significantly influence the final results [25].…”
mentioning
confidence: 99%
“…The SH intensity generated from the multilayer structure is then given by The SH fields E 1 and E 2 represent the contributions from the air-silica interface in region 1 and silica-air interface in region 2, respectively, and E 3 corresponds to the total contribution from the nanocomposite layers. For p -polarized fundamental and SHG light, as used in the Maker-fringe measurements, they can be expressed as2728 and Here, the constants , and 30 represent the independent tensor components of the second-order surface response of the air-silica interface which are defined in terms of the fields inside the material. , on the other hand, is a constant, where e p is the amplitude of the incident p -polarized beam and h n , h S and D denote the thickness of the silver-decorated nanoparticle layer, fused silica layer and glass substrate, respectively.…”
Section: Modellingmentioning
confidence: 99%