2012
DOI: 10.1088/0957-0233/23/3/035008
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Calibration of the scales of areal surface topography-measuring instruments: part 1. Measurement noise and residual flatness

Abstract: In this paper, we present methods for determining the measurement noise and residual flatness of areal surface topography-measuring instruments. The methods are compliant with draft international specification standards on areal surface texture. We first introduce the international standards framework and then present current methods based on averaging and subtraction to isolate the measurement noise and residual flatness from the sample surface topography. These methods are relatively difficult to apply and t… Show more

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Cited by 94 publications
(76 citation statements)
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“…By assigning distributions to the MC, the uncertainties associated with the x, y and z measurements can be estimated. NPL [51][52][53] recommend appropriate distributions that could be assigned to each MC. Throughout the development of MCs, it has been envisaged that an instrument's calibration routine, i.e.…”
Section: The Current Iso Frameworkmentioning
confidence: 99%
“…By assigning distributions to the MC, the uncertainties associated with the x, y and z measurements can be estimated. NPL [51][52][53] recommend appropriate distributions that could be assigned to each MC. Throughout the development of MCs, it has been envisaged that an instrument's calibration routine, i.e.…”
Section: The Current Iso Frameworkmentioning
confidence: 99%
“…A simple STR test is to measure a smooth, flat part twice, subtract the difference of the two resulting topography maps, and calculate the standard deviation S q of this difference map [6,9,14]. The STR, denoted here as N M , is…”
Section: Instrument Noisementioning
confidence: 99%
“…For these systems, a meaningful expression of STR would be a dimensional value together with a height-scanning rate and the corresponding camera format, as in STR = 0.1 nm at 10 µm/s for 1 k × 1 k pixels. A simple STR test is to measure a smooth, flat part twice, subtract the difference of the two resulting topography maps, and calculate the standard deviation Sq of this difference map [6,9,14]. The STR, denoted here as M N , is…”
Section: Instrument Noisementioning
confidence: 99%
“…Several members of TC 213 proposed a simplification, in which a unified set of metrological characteristics that were instrument-independent would provide a core set of terminology and concepts that would appear in 25178-600 and would be echoed in all of the 6XX series documents. Three published papers provide the basis for this set of metrological characteristics [13][14][15], and with a little adjustment these ideas were adopted by WG 16 in 2010.…”
Section: Standards Rash -The 6xx Seriesmentioning
confidence: 99%