Calibrating the Six-Port Reflectometer by Means of Sliding Terminations

Engen, Glenn F.

doi:10.1109/tmtt.1978.1129527

Cited by 199 publications

(80 citation statements)

References 3 publications

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“…With Pz, P\, and P 5 denoting the powers measured at three of the six-port's detectors, Engen has shown that a sliding termination traces out an ellipse in the P3/P5 -P4/P5 plane [11]. Sliding load measurements taken with the sampled-line reflectometer investigated in this work are shown in figure 6.…”

Section: A System Calibrationmentioning

confidence: 88%

“…This conversion, which involves finding five calibration constants that are a property of the network architecture, is most easily accom- plished using a sliding termination. Details of this procedure are well-documented [11] and will not be repeated here. The second part of the calibration consists of the familiar technique of using three well-characterized standards to determine the error coefficients in the four-port reflectometer model.…”

Section: Introductionmentioning

confidence: 99%

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Diode-Based Integrated Circuits for Millimeter and Submillimeter-Wave Identification of Chemical and Biological Agents

Weikle¹,

Crowe²

2001

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Public Reporting burden for this collection of information is estimated to average 1 hour per response, including ihe lime for reviewing instructions, searchmg existing data sources ath nneand maintaining the data needed, and complefng and reviewing the collection of information. Send comment regarding *,, burden estates or ^ «£^< "^ «" of information, including suggestions for reducing this burden, to. Washington Headquarters-Services. Directorate «^^^"X Suite P04 Arlington. VA 22202-4302. and to the Office of Management and Budget, Paperwork Reduction Project (0704-0188.) Washington. DC 20503.--rr-r -T"T "r-n^r*^ r^ A -r-ri-i c-* ->nni 1 DPE This final report summarizes efforts to realize a device and sensor technology for the study, detection, and indemnification of chemical and biological agents at millimeter and submillimeter-wave frequencies. This effort has focused on two goals: (1) the realization of an integrated-circuit technology for Terahertz Schottky diodes and (2) the development of sampledline reflectometers for measuring the return loss (and consequently, absorption spectra) of chemical and bioagentt samples. Schottky diodes represent the most successful device technology for applications in the submilhmeter and terahertz region of the electromagnetic spectrum and these devices are the critical components used in most heterodyne receivers and harmonic generators for radio astronomy and atmospheric remote sensing. Integrated planar diodes allow vast improvements in the level of performance of systems tbat rely on Schottky technology and permit the realization of fully integrated spectrometers and other instruments for chem/bio detection.During the past year and a half of this project, we have developed a beamlead diode processing technology for producing planar chips that can be readily integrated into external circuitry. These discrete diodes will allow rapid prototyping of circuits and systems and permit higher levels of performance by eliminating many of the difficulties associated with manual assembly of hybrid components. In addition, we have developed millimeter and submillimeter-wave reflectometers based on the sampled-line architecture. These reflectometers can be used to measure the complex reflection coefficients (magnituce and phase) of various chemical and biological materials and utlize the planar Schottky device technology previously mentioned. Two primary areas of progress have been made over the past year and a half on this research program. The first is the development of planar Schottky diode fabrication technologies for detectors and sources to be used in spectroscopic instrumentation. The second area of progress is the research and development of a sampled-line analyzer for the measurement of complex reflection coefficients (both magnitude and phase). The sampled-line analyzer uses a relatively simple circuit architecture and will allow our measurement capabilities to be extended beyond W-band and to frequencies approaching 1 THz. This will allow us to measure and accurately c...

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Section: A System Calibrationmentioning

confidence: 88%

Section: Introductionmentioning

confidence: 99%

Diode-Based Integrated Circuits for Millimeter and Submillimeter-Wave Identification of Chemical and Biological Agents

Weikle¹,

Crowe²

2001

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“…The fundamental operation and theory of the six-port reflectometer has been described in detail in previous papers, many algorithms that have been developed for calibrating six-port refiectometers, the six-port-to-fourport reduction technique given by Engen (1978) is among the most widely used.…”

Section: Six-port Theorymentioning

confidence: 99%

A Six-Port Reflectometer Calibration Using Wilkinson Power Divider

Moubarek¹,

Gharsallah²

2016

American Journal of Engineering and Applied Sciences

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A new calibration method for a six-port reflectometer which minimizes the effect of power measurement errors is presented. It is based on the power divider correlator to obtain estimates of the six-port calibration constants. The calibration procedure is to determine the constants that govern the operation of the six-port from the measurement of power or output ports tensions by placing five to eleven standard loads in succession to DUT. A load and four offset shorts are used as reflection standards. Computer simulation results are presented to show that the described procedure substantially reduces the overall error in the calibration constants.

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“…Third, hardware imperfections and wideband characteristics can be improved by calibrating the multi-port junction. [6][7] However, there have been no direct and quantitative methods but bit error rate (BER) to measure the performances of MPDRs. [5, 8～10] This paper, first, theoretically analyzes impairment Hence, I m (t) and Q m (t) can be regenerated in terms of the linear combination Pi(t).…”

Section: ⅰ 서 론mentioning

confidence: 99%

Improvement in Image Rejection of Multi-Port Junction-based Direct Receivers

Park¹

2012

Journal of the Institute of Electronics Engineers of Korea

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This paper presents an iterative single-frequency continuous-wave signal-based I/Q regeneration method for improving image-rejection performance of multi-port junction-based direct receivers (MPDRs). This paper analyzes I/Q regeneration in MPDRs as I/Q mismatch compensation for direct conversion receivers. Based on the analysis, this paper evaluates the accuracy of I/Q regeneration in terms of the image-rejection ratio (IRR). The proposed method improves the IRR performance more than 20 dB compared to existing I/Q regeneration methods. Simulation results show that MPDRs using the proposed method can achieve an IRR of more than 70 dB, and that the bit error rate performances are almost the same as those of conventional coherent demodulators, even in fading channels.

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Calibrating the Six-Port Reflectometer by Means of Sliding Terminations

Cited by 199 publications

References 3 publications

Diode-Based Integrated Circuits for Millimeter and Submillimeter-Wave Identification of Chemical and Biological Agents

Diode-Based Integrated Circuits for Millimeter and Submillimeter-Wave Identification of Chemical and Biological Agents

A Six-Port Reflectometer Calibration Using Wilkinson Power Divider

Improvement in Image Rejection of Multi-Port Junction-based Direct Receivers

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