Calculation of the escape peak for GeLi and NaI radiation detectors

Fioratti, M. Paganini; Piermattei, S.

doi:10.1016/0029-554x(71)90179-0

Cited by 42 publications

(11 citation statements)

References 7 publications

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“…We suspected that this discontinuity comes from the mutual influence between the shelf and tail parameters during the fitting. Therefore, we used Eqn (21) in the fitting procedure, re-evaluating the tail parameters. No change was observed in the discontinuity in the tail fractions.…”

Section: Tail Fractionmentioning

confidence: 99%

“…The results for the Kˇtail widths show even more scatter, due to the difficulty to fit the Kˇtail in comparison with the K˛tail as discussed above. In order to verify the absence of a mutual influence between the fitting parameters, we estimated the tail widths again after implementing Eqns (21) and (23) in the fitting procedure. A set of 10 spectra was used.…”

Section: Tail Widthsmentioning

confidence: 99%

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Implementation of a spectrum fitting procedure using a robust peak model

2003

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The need for an accurate description of characteristic x-ray lines has led to the development of complex peak models that combine a Gauss, a shelf and a tail function. Via relationships that describe the shelf and tail parameters as a function of the energy, it is possible to reduce the number of fit parameters significantly. In this work, we carried out an experiment to study the shelf and tail parameters obtained with an HPGe detector. We observed a strong discontinuity in the shelf and tail parameters around the K-edge energy of Ge. This indicates that these parameters are strongly dependent on the mass-attenuation coefficient of the detector material. Therefore, we propose relationships that describe those parameters as a function of the energy and the mass-attenuation coefficient. The implementation of these relationships in a fitting procedure results in a more robust fitting procedure with a much smaller number of fitting parameters. Excellent fits for HPGe spectra can be obtained. Because the detector dependence seems to be fairly general, we could successfully apply the model to Si(Li) spectra also.

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Section: Tail Fractionmentioning

confidence: 99%

Section: Tail Widthsmentioning

confidence: 99%

Implementation of a spectrum fitting procedure using a robust peak model

2003

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“…Several studies on the CdTe, HgI 2 , Si(Li), Ge(Li), NaI escape peaks have been performed. [1][2][3][4][5][6][7] In this study, incident radiation energy and region area seen by the crystal dependence of fluorescence escape peak-to-photopeak intensity ratios and escape fractions of characteristic K X-rays were measured for the Ge(Li) detector. The experimental results are compared with theoretical predictions.…”

Section: Introductionmentioning

confidence: 99%

X-RAY FLUORESCENCE ESCAPE PEAKS IN Ge(Li) DETECTORS

Durak

Özdemır

2001

Instrumentation Science & Technology

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“…One of the often-cited studies of Ge K˛and Kˇescape as a function of energy is that by Christensen, 12 who obtained good agreement between measured and calculated relative intensities. Christensen's calculations were essentially based on earlier work by Fioratti and Piermattei, 13 who considered an infinite crystal and neglected Ge Kˇescape. Seltzer's 14 analytical and Monte Carlo calculations showed good agreement with that work.…”

Section: Introductionmentioning

confidence: 99%

Photoelectron, Compton and characteristic x‐ray escape from an HPGe Detector in the range 8–52 keV

Yılmaz

Can

2004

X-Ray Spectrometry

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Escape of photoelectrons, Compton-scattered photons and Ge x-rays from an HPGe detector was studied as a function of energy in the range 8-52 keV. A variable-energy source producing Cu, Rb, Mo, Ag, Ba, and Tb x-rays was used. All three mechanisms for energy loss were observed in the same experiment for Ba and Tb, while only x-ray and photoelectron escapes were evident in the spectra for Ag, Mo, Rb, and Cu. Spectral features and possible mechanisms for partial energy deposition were investigated. A Monte Carlo program was used to simulate the relevant interactions, and to estimate the escape probabilities.

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Calculation of the escape peak for GeLi and NaI radiation detectors

Cited by 42 publications

References 7 publications

Implementation of a spectrum fitting procedure using a robust peak model

Implementation of a spectrum fitting procedure using a robust peak model

X-RAY FLUORESCENCE ESCAPE PEAKS IN Ge(Li) DETECTORS

Photoelectron, Compton and characteristic x‐ray escape from an HPGe Detector in the range 8–52 keV

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