Photoelectron, Compton and characteristic x‐ray escape from an HPGe Detector in the range 8–52 keV

Abstract

Escape of photoelectrons, Compton-scattered photons and Ge x-rays from an HPGe detector was studied as a function of energy in the range 8-52 keV. A variable-energy source producing Cu, Rb, Mo, Ag, Ba, and Tb x-rays was used. All three mechanisms for energy loss were observed in the same experiment for Ba and Tb, while only x-ray and photoelectron escapes were evident in the spectra for Ag, Mo, Rb, and Cu. Spectral features and possible mechanisms for partial energy deposition were investigated. A Monte Carlo program was used to simulate the relevant interactions, and to estimate the escape probabilities.

Atomic spectrometry update. X-Ray fluorescence spectrometry

“…The escape peaks are a particular challenge when using a HPGe detector and a detailed study of these was made by Yilmaz and Can. 67 The authors studied characteristic Compton and photoelectron escape events for peaks in the energy range 8-52 keV, using a variable energy source providing X-rays in increasing K line energy from Cu, Rb, Mo, Ag, Ba and Tb. All three escape mechanisms were observed for Ba and Tb X-rays while only characteristic and photoelectron escape was observed for the other lines.…”