1970
DOI: 10.1147/rd.141.0066
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Calculation of the Current Density in the Contacts of a Thin Film Resistor

Abstract: The two-dimensional boundary value problem appropriate to current flow in a film resistor is examined. A simple closedform solution for current density into the contact is found to exist for the important case of a thin film resistor with extended lands. The spatial dependence of the current density into the contact is found to be similar to that obtained by Kennedy and Murley for the diffused resistor, with film thickness entering the functional dependence in a role analogous to the diffusion length of the do… Show more

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Cited by 10 publications
(3 citation statements)
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“…This region can be transformed into Fig. 4 by using Overmeyer's transformation (Overmeyer 1970). The values of a,, b, and c , are given by Overmeyer (1970).…”
Section: Finite-thickness Coplanar Waveguidementioning
confidence: 99%
“…This region can be transformed into Fig. 4 by using Overmeyer's transformation (Overmeyer 1970). The values of a,, b, and c , are given by Overmeyer (1970).…”
Section: Finite-thickness Coplanar Waveguidementioning
confidence: 99%
“…With this new supposition, R, can be written : Rc = (P B/w ) v' 17 + 0.2 coth 03C4/ ~ + 0.2 . 9The ETLM establishes a transition between the TLM ( n -oo ) and the model proposed by Kennedy et al [14] which gives the streamlines distribution in the vicinity of the contact when Pc = 0 (~ = 0 ) (see also [15] and [16] However, for 17 0.2, the spreading resistance is the main contribution to Rce the contribution caused by the contact resistivity fades, and the ETLM does not allow anymore statement about 03C1c.…”
mentioning
confidence: 98%
“…In [18], two-dimensional current distribution under the contact is numerically solved for a top contact. In [19], current distribution in thin film resistor is analytically solved by using conformal mapping.…”
mentioning
confidence: 99%