Calculation of line profiles of inhomogeneous solar formations

Kurochka, L. N.; Tel'Nyuk-Adamchuk, V. V.

doi:10.1007/bf00154927

Cited by 3 publications

(1 citation statement)

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“…This last quantity Dn thin is therefore needed in order to quantify the opacity of a line. It is assumed here that the observational spatial resolution is sufficiently high to rule out additional line broadening of optically thin lines due to organized mass motions on a large scale (as considered, e.g., by Rompolt 1975 andKurochka &Telnyuk-Adamchuk 1978). Basically, the linewidth Dl thin of an appropriate optically thin line l thin must be measured to obtain Dn thin , and this is explicitly available in some cases.…”

Section: The Intrinsic (Scattering) Line Profile Halfwidthmentioning

confidence: 99%

An intensity/linewidth analysis of opacity: first applications to a solar prominence and He II line profiles

Kastner¹,

Bhatia

1998

Monthly Notices of the Royal Astronomical Society

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An analysis is described which can derive optical thicknesses and associated quantities from measured intensities and linewidths using convenient expressions for photon escape probabilities and for opacity‐broadened line halfwidths. An associated analysis of the effect of observational errors is provided. The analysis treats intensities and linewidths independently so that internal consistency of results can provide a measure of observational accuracy, which is shown here to be a stringent requirement. As examples, first applications are made to Si II lines in a solar prominence and to some high‐resolution observations of the solar He II 303.78‐Å resonance line.

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Section: The Intrinsic (Scattering) Line Profile Halfwidthmentioning

confidence: 99%