“…The crystalline structures of the resulting CTS films were characterized by X-ray diffraction (XRD) and grazing-incidence XRD (GI-XRD) which were performed by a PANalytical X'Pert PRO Materials Research Diffractometer with Cu K␣ radiation ( = 0.15406 nm). The incident angles for GI-XRD measurement were 0.3, 1.0, and 2.0 • , corresponding to the X-ray penetration depths of 190, 630, and 1270 nm, respectively [22]. Raman scattering measurement, utilizing Raman scattering spectrometer (Jasco NRS-3100), was performed with a 532-nm line by a YAG laser with a data resolution of 0.01 cm −1 to investigate crystallographic structure of CTS films.…”