2010
DOI: 10.1002/jps.22202
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Calculation of Effective Penetration Depth in X-Ray Diffraction for Pharmaceutical Solids

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Cited by 53 publications
(36 citation statements)
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“…To understand variation in the phase transformation at the different regions of the tablets, depth profiling was carried out. In pharmaceutical context, GIXD has been employed previously to study phase transformation during dissolution (31) and compaction (22) and to evaluate effective penetration depth of X-rays in the tablets (32). In the current work, the potential of GIXD was further extended to evaluate the difference in stability of the different solid forms of three model drug substances towards the compaction.…”
Section: Discussionmentioning
confidence: 98%
See 1 more Smart Citation
“…To understand variation in the phase transformation at the different regions of the tablets, depth profiling was carried out. In pharmaceutical context, GIXD has been employed previously to study phase transformation during dissolution (31) and compaction (22) and to evaluate effective penetration depth of X-rays in the tablets (32). In the current work, the potential of GIXD was further extended to evaluate the difference in stability of the different solid forms of three model drug substances towards the compaction.…”
Section: Discussionmentioning
confidence: 98%
“…The GIXD technique is unique in the sense that it can provide detailed information on the phase composition at the different depths parallel to the tablet surface (22,(30)(31)(32). As the surface is the first part of the tablet that comes into contact with dissolution medium, information on the surface layer is important with respect to the initial dissolution of the tablet.…”
Section: Introductionmentioning
confidence: 99%
“…The crystalline structures of the resulting CTS films were characterized by X-ray diffraction (XRD) and grazing-incidence XRD (GI-XRD) which were performed by a PANalytical X'Pert PRO Materials Research Diffractometer with Cu K␣ radiation ( = 0.15406 nm). The incident angles for GI-XRD measurement were 0.3, 1.0, and 2.0 • , corresponding to the X-ray penetration depths of 190, 630, and 1270 nm, respectively [22]. Raman scattering measurement, utilizing Raman scattering spectrometer (Jasco NRS-3100), was performed with a 532-nm line by a YAG laser with a data resolution of 0.01 cm −1 to investigate crystallographic structure of CTS films.…”
Section: Experimental Methodsmentioning
confidence: 99%
“…In order to investigate the crystalline structures of the CTS film with different depths, GI-XRD measurements were conducted with different incident angles of 0.3, 1.0, and 2.0 • , which are consistent with the X-ray penetration depths into CTS films of 190, 630, and 1270 nm, respectively [22]. Fig.…”
Section: Influence Of Naf On Formation Of Cts Grainmentioning
confidence: 99%
“…All of the potentials were measured against a saturated calomel reference electrode (SCE), and the auxiliary electrode was a platinum foil. Additionally, the immersion test was implemented in 10% HCl solution for 24 h. The study also examines the gas nitrided layer by analyzing the nitrided sample via the grazing incidence X-ray diffraction (GIXRD) technique [16][17][18][19][20]. Figure 2 summarizes those results indicating that additional phases appear up until the γ phase is detected with increasing incidence angles (Ω: from 1.0° to 5.0°).…”
Section: Corrosion Test and Immersion Testmentioning
confidence: 99%