Single Crystals of Electronic Materials 2019
DOI: 10.1016/b978-0-08-102096-8.00008-2
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Cadmium telluride and cadmium zinc telluride

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Cited by 11 publications
(22 citation statements)
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“…The partial pressures of both argon and oxygen in the vacuum chamber during the deposition process were 400 mPa. The magnetron power was~150 W. The deposition process lasted for 10 min at the CdTe substrate temperature of~100 • C. In terms of the practical application of the developed CdTe-based structures for detection of X/γ-ray radiation, it is important to analyze the reverse branches of the I-V characteristics when the Schottky contact is biased positively with respect to the MoO x -Mo ohmic contact because of diode-type detectors operate under reverse bias [4][5][6][7][8]. It should be noted that the reverse currents in the heterostructures under investigation are equal to several nanoamperes at bias voltages of~50-100 V at room temperature (Figure 3).…”
Section: Schottky Contact Formationmentioning
confidence: 99%
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“…The partial pressures of both argon and oxygen in the vacuum chamber during the deposition process were 400 mPa. The magnetron power was~150 W. The deposition process lasted for 10 min at the CdTe substrate temperature of~100 • C. In terms of the practical application of the developed CdTe-based structures for detection of X/γ-ray radiation, it is important to analyze the reverse branches of the I-V characteristics when the Schottky contact is biased positively with respect to the MoO x -Mo ohmic contact because of diode-type detectors operate under reverse bias [4][5][6][7][8]. It should be noted that the reverse currents in the heterostructures under investigation are equal to several nanoamperes at bias voltages of~50-100 V at room temperature (Figure 3).…”
Section: Schottky Contact Formationmentioning
confidence: 99%
“…In view of the perspectives of employing the developed X/γ-ray detectors for spectroscopy, it is important that the I-V characteristic of the Ti-TiN/p-CdTe/MoO x -Mo Schottkydiode detector is linear in the voltage range of 15 V < |V| < 110 V (Figure 4d). Substitution V = −10 V into Equation (4) shows that the width of the SCR equals~0.48 mm, i.e., at |V| > 10 V the depleted region occupies the entire thickness of the semiconductor crystal (d = 0.5 mm). In this case, the CdTe crystal behaves like a sample with a resistivity (R = (4-5) × 10 10 Ω) higher than that of the bulk (neutral) part of the semiconductor (R = (6-7) × 10 9 Ω).…”
Section: Electrical Characteristics Ofmentioning
confidence: 99%
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