2012 Design, Automation &Amp; Test in Europe Conference &Amp; Exhibition (DATE) 2012
DOI: 10.1109/date.2012.6176428
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CACTI-3DD: Architecture-level modeling for 3D die-stacked DRAM main memory

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Cited by 76 publications
(90 citation statements)
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“…Apart from this, the granularity at which TSVs are placed can be either coarse-or fine-grained, similar to the approach in CACTI-3DD [6]. This granularity defines how many TSVs are placed and what portions of a cache (e.g., peripheral circuits or memory cells) reside on different dies.…”
Section: D Modelmentioning
confidence: 99%
See 3 more Smart Citations
“…Apart from this, the granularity at which TSVs are placed can be either coarse-or fine-grained, similar to the approach in CACTI-3DD [6]. This granularity defines how many TSVs are placed and what portions of a cache (e.g., peripheral circuits or memory cells) reside on different dies.…”
Section: D Modelmentioning
confidence: 99%
“…A few previous works (e.g., [6]) assume that TSVs in face-to-back are buffered, which may lead to redundant buffering in some designs and also increases the latency and energy overhead of the TSVs. This overhead may be acceptable in large-sized DRAMs that are modeled in CACTI-3DD, but is unacceptable in caches that are relatively smaller in size and becomes increasingly obvious with smaller memory macro designs.…”
Section: D Modelmentioning
confidence: 99%
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“…The wire model in CACTI-3DD [56] is used to estimate the 3D DRAM bus delay, where 1 mm wire introduces 0.087 and 0.03 ns delay for TSV at 45-nm process node. As the RC delay is proportional to wire length, the longest route from memory controller across 8 layers to the corner of DRAM layer is around 4.9 mm, thus introduces 0.42 ns delay.…”
Section: Test Environmentsmentioning
confidence: 99%