A first principles study of the lattice stability of diamond-structure semiconductors under intense laser irradiation J. Appl. Phys. 113, 023301 (2013) High-order sideband generation in bulk GaAs Appl. Phys. Lett. 102, 012104 (2013) Defect mediated reversible ferromagnetism in Co and Mn doped zinc oxide epitaxial films J. Appl. Phys. 112, 113917 (2012) Time-domain sampling of x-ray pulses using an ultrafast sample response Appl. Phys. Lett. 101, 243106 (2012) The effects of vacuum ultraviolet radiation on low-k dielectric films App. Phys. Rev. 2012Rev. , 12 (2012 Additional information on J. Appl. Phys. Melting and rapid solidification is induced in 50-nm-thick amorphous Ge films on glass substrates by single laser pulses at 583 nm with a duration of 10 ps. The solidification process is followed by means of reflectivity measurements with ns time resolution both at the air/film ͑front͒ and the substrate/film ͑back͒ interfaces. Due to interference effects between the light reflected at the filmsubstrate and film-liquid interfaces, the back side reflectivity measurements turn out to be very sensitive to the melt depth induced by the laser pulse and their comparison to optical simulations enables the determination of the solidification dynamics. For low fluences, only a thin layer of the film is melted and solidification occurs interfacially leading to reamorphization of the molten material. The results provide a critical interface velocity for amorphization of ϳ4 m/s, much slower than the one that has widely been reported for elementary semiconductors. For high fluences, the molten layer depth approaches the film thickness and the results are consistent with a bulk solidification process. In this case, recalescence effects upon solid phase nucleation become important and lead to the formation of crystallites distributed throughout the whole resolidified volume.