Built-in self-diagnosis and test time reduction techniques for NAND flash memories

Chou, Chung‐Kuang; Hou, Chih-Sheng; Li, Jin-Fu

doi:10.1109/vdat.2011.5783625

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(3 citation statements)

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“…In ref. [7], a low‐cost built‐in self‐diagnosis (BISD) scheme is presented which can support different march‐like test algorithms with page‐oriented data patterns. Ref.…”

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

An efficient built‐in error detection methodology with fast page‐oriented data comparison in 3D NAND flash memories

Cao

Liu

Wang

et al. 2022

Electronics Letters

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This letter presents an efficient built‐in error detection methodology for 3D NAND flash memories, in which fast page‐oriented data comparison and column parallel error detection are firstly proposed. The methodology takes advantage of the characteristics of page buffer to perform fast page‐oriented comparison between test data and reference data. Thanks to that, both fine error detection mode and column parallel error detection mode can be supported for different test scenarios. Analytical results show that it costs about 164.14 μs and 460 ns in fine and column parallel mode respectively to detect a page which is 16 K bytes. Compared with previous work, the error detection time of the proposed column parallel mode is reduced 99.7% for 3D NAND flash memories.

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“…In ref. [7], a low‐cost built‐in self‐diagnosis (BISD) scheme is presented which can support different march‐like test algorithms with page‐oriented data patterns. Ref.…”

Section: Introductionmentioning

confidence: 99%

“…Test time reduction techniques were also discussed in ref. [7], including two‐plane parallel read and interleaving program and read.…”

Section: Introductionmentioning

confidence: 99%

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An efficient built‐in error detection methodology with fast page‐oriented data comparison in 3D NAND flash memories

Cao

Liu

Wang

et al. 2022

Electronics Letters

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A New Accelerated Endurance Test for Terabit NAND Flash Memory Using Interference Effect

Cha

Kang

Chung

et al. 2015

IEEE Trans. Semicond. Manufact.

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Built-in self-diagnosis and test time reduction techniques for NAND flash memories

Cited by 2 publications

References 7 publications

An efficient built‐in error detection methodology with fast page‐oriented data comparison in 3D NAND flash memories

An efficient built‐in error detection methodology with fast page‐oriented data comparison in 3D NAND flash memories

A New Accelerated Endurance Test for Terabit NAND Flash Memory Using Interference Effect

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