2008
DOI: 10.1063/1.2894184
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Buckling of ZnO nanowires under uniaxial compression

Abstract: Bending flexibility, kinking, and buckling characterization of ZnO nanorods/nanowires grown on different substrates by high and low temperature methods

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Cited by 61 publications
(45 citation statements)
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References 19 publications
(15 reference statements)
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“…Figure 5 shows the load-displacement curve for the nanoindentation of NWs deposited on paper substrate. It is possible to observe that with a maximum load of 50 µN, the NW column is in stable equilibrium in the straight position, i.e., there is no buckling [29][30]. The experiment also shows that, during the time that the nanoindenter applies the maximum force, the curves present a creep of 35 nm.…”
Section: Converse Piezoelectric Effectmentioning
confidence: 79%
“…Figure 5 shows the load-displacement curve for the nanoindentation of NWs deposited on paper substrate. It is possible to observe that with a maximum load of 50 µN, the NW column is in stable equilibrium in the straight position, i.e., there is no buckling [29][30]. The experiment also shows that, during the time that the nanoindenter applies the maximum force, the curves present a creep of 35 nm.…”
Section: Converse Piezoelectric Effectmentioning
confidence: 79%
“…Especially in the case of piezoelectric nanodevices, their mechanical characterization and most notably the study of the buckling behavior of a given nanostructure are extremely important. As of today, buckling studies have focused mainly on carbon nanotubes and on ZnO nanorods/nanowires [566,[601][602][603][604][605][606][607]. Most notably wurtzite ZnO, due to its noncentrosymmetric nature, has been used as piezoelectric material, for example in piezoelectric thin films for highfrequency bulk acoustic wave and surface acoustic wave transducers and resonators.…”
Section: Bucklingmentioning
confidence: 99%
“…On the basis of the Euler buckling model, the Young's modulus and some other mechanical parameters have been estimated. [18][19][20][21] When the tip radius of the indenter is much larger than the cross section of the SiNWs, there is no lateral resolution in the indentation system to identify the exact location of the indenter tip relative to a single SiNW. During an indentation test, a single nanowire first deforms and then becomes displaced.…”
Section: Introductionmentioning
confidence: 99%