The piezoelectric power generation from ZnO nanowire arrays grown on different substrates using different methods is investigated. ZnO nanowires were grown on n‐SiC and n‐Si substrates using both the high‐temperature vapor liquid solid (VLS) and the low‐temperature aqueous chemical growth (ACG) methods. A conductive atomic force microscope (AFM) is used in contact mode to deflect the ZnO nanowire arrays. No substrate effect was observed but the growth method, crystal quality, density, length, and diameter (aspect ratio) of the nanowires are found to affect the piezoelectric behavior. During the AFM scanning in contact mode without biasing voltage, the ZnO nanowire arrays grown by the VLS method produced higher and larger output voltage signal of 35 mV compared to those grown by the ACG method, which produce smaller output voltage signal of only 5 mV. The finite element (FE) method was used to investigate the output voltage for different aspect ratio of the ZnO nanowires. From the FE results it was found that the output voltage increases as the aspect ratio increases and starts to decreases above an aspect ratio of 80 for ZnO nanowires.

Bending flexibility, kinking, and buckling characterization of ZnO nanorods/nanowires grown on different substrates by high and low temperature methods

Light emitting diodes (LEDs) based on n-ZnO nanorods (NRs)/p-4H-SiC and n-ZnO (NRs)/p-GaN were fabricated and characterized. For the two LEDs the ZnO NRs were grown using a low temperature (<100 • C) aqueous chemical growth (ACG) technique. Both LEDs showed very bright nearly white light electroluminescence (EL) emission. The observed luminescence was a result of the combination of three emission lines composed of violet-blue, green and orange-red peaks observed from the two LEDs. Room temperature photoluminescence (PL) was also measured and consistency with EL was observed. It was found that the green and violet-blue peaks are red-shifted while the orange peak is blue-shifted in the EL measurement. It was also found that due to the effect of the GaN substrate the violet-blue peak in the EL measurement is more red-shifted in n-ZnO (NRs)/p-GaN LEDs as compared to n-ZnO (NRs)/p-4H-SiC LEDs.

Buckling and elastic stability study of vertical well aligned ZnO nanorods grown on Si substrate and ZnO nanotubes etched from the same nanorods was done quantitatively by nanoindentation technique. The critical load, modulus of elasticity, and flexibility of the ZnO nanorods and nanotubes were observed and we compared these properties for the two nanostructures. It was observed that critical load of nanorods (2890 μN) was approximately five times larger than the critical load of the nanotubes (687 μN). It was also observed that ZnO nanotubes were approximately five times more flexible (0.32 nm/μN) than the nanorods (0.064 nm/μN). We also calculated the buckling energies of the ZnO nanotubes and nanorods from the force displacement curves. The ratio of the buckling energies was also close to unity due to the increase/decrease of five times for one parameter (critical load) and increase/decrease of five times for the other parameter (displacement) of the two samples. We calculated critical load, critical stress, strain, and Young modulus of elasticity of single ZnO nanorod and nanotube. The high flexibility of the nanotubes and high elasticity of the ZnO nanorods can be used to enhance the efficiency of piezoelectric nanodevices. We used the Euler buckling model and shell cylindrical model for the analysis of the mechanical properties of ZnO nanotubes and nanorods.

Mechanical instability and buckling characterization of vertically aligned single-crystal ZnO nanorods grown on different substrates including Si, SiC and sapphire (α-Al(2)O(3)) was done quantitatively by the nanoindentation technique. The nanorods were grown on these substrates by the vapor-liquid-solid (VLS) method. The critical load for the ZnO nanorods grown on the Si, SiC and Al(2)O(3) substrates was found to be 188, 205 and 130 µN, respectively. These observed critical loads were for nanorods with 280 nm diameters and 900 nm length using Si as a substrate, while the corresponding values were 330 nm, 3300 nm, and 780 nm, 3000 nm in the case of SiC and Al(2)O(3) substrates, respectively. The corresponding buckling energies calculated from the force displacement curves were 8.46 × 10(-12), 1.158 × 10(-11) and 1.092 × 10(-11) J, respectively. Based on the Euler model for long nanorods and the J B Johnson model (which is an extension of the Euler model) for intermediate nanorods, the modulus of elasticity of a single rod was calculated for each sample. Finally, the critical buckling stress and strain were also calculated for all samples. We found that the buckling characteristic is strongly dependent on the quality, lattice mismatch and adhesion of the nanorods with the substrate.