BS 1149.1 extensions for an online interconnect fault detection and recovery

Sadeghi-Kohan, Somayeh; Namaki-Shoushtari, Majid; Javaheri, Fatemeh Negin; Navabi, Zainalabedin

doi:10.1109/test.2012.6401583

Cited by 6 publications

(2 citation statements)

References 16 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Here specific defect and aging mechanisms such as crosstalk or electromigration (EM) must be addressed, which can manifest themselves for example as delay faults or glitches at the gate level. In this context, the BIST and monitoring schemes proposed in [4,11,17,32,34,36,37,41,47,49,55,56], focus on manufacturing test, but they do not address the requirements and challenges of health monitoring during the lifetime. Nevertheless, because of the complex interplay between EM and crosstalk, periodic testing of interconnects is mandatory and at the same time Communicated by S. N. Demidenko extremely challenging.…”

Section: Introductionmentioning

confidence: 99%

Stress-Aware Periodic Test of Interconnects

2021

Self Cite

View full text Add to dashboard Cite

Safety-critical systems have to follow extremely high dependability requirements as specified in the standards for automotive, air, and space applications. The required high fault coverage at runtime is usually obtained by a combination of concurrent error detection or correction and periodic tests within rather short time intervals. The concurrent scheme ensures the integrity of computed results while the periodic test has to identify potential aging problems and to prevent any fault accumulation which may invalidate the concurrent error detection mechanism. Such periodic built-in self-test (BIST) schemes are already commercialized for memories and for random logic. The paper at hand extends this approach to interconnect structures. A BIST scheme is presented which targets interconnect defects before they will actually affect the system functionality at nominal speed. A BIST schedule is developed which significantly reduces aging caused by electromigration during the lifetime application of the periodic test.

show abstract

Section: Introductionmentioning

confidence: 99%

Stress-Aware Periodic Test of Interconnects

2021

Self Cite

View full text Add to dashboard Cite

show abstract

“…One of the drawbacks of using this method is the inability of detecting timing related faults. Several researchers modified the IEEE Boundary Scan 1149.1 standard for interconnect crosstalk fault testing [3,4]. This paper addresses the issue of interconnect testing in offline mode considering MDSI fault model.…”

Section: Introductionmentioning

confidence: 99%

An off-line MDSI interconnect BIST incorporated in BS 1149.1

Mohammadi

Sadeghi-Kohan

Masoumi

et al. 2014

2014 19th IEEE European Test Symposium (ETS)

Self Cite

View full text Add to dashboard Cite

This paper presents an off-line interconnect test methodology that implements the MDSI (Maximal Dominant Signal Integrity) crosstalk fault model. The test methodology consists of MDSI test pattern generators and response analyzers that are incorporated into the IEEE BS 1149.1 Standard on the two sides of an interconnect. This work is the first in implementing MDSI hardware structure. Our method is compared with hardware structures implementing MA interconnect tests.

show abstract