2020
DOI: 10.31399/asm.cp.istfa2020p0261
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Bridge Defect Case Inside Digital Circuitry

Abstract: The aim of this paper is to present a typical bridge defect case inside digital circuitry, from diagnosis to emission point of view. Specific considerations have allowed to establish the exact point of failure. Keywords— bridge defect, aggressor and victim, region of intersection

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Cited by 2 publications
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“…Furthermore, in case of multiple chain failures, LVI approach become inapplicable and for this reason some improved patterns have been developed in the past for these cases [2][3]. Very often, in these cases characterized by multiple candidates, the responsible for the failure is a common interconnection shared among all the candidate flip-flops, such as a reset input [4] or a clock signal.…”
Section: Introductionmentioning
confidence: 99%
“…Furthermore, in case of multiple chain failures, LVI approach become inapplicable and for this reason some improved patterns have been developed in the past for these cases [2][3]. Very often, in these cases characterized by multiple candidates, the responsible for the failure is a common interconnection shared among all the candidate flip-flops, such as a reset input [4] or a clock signal.…”
Section: Introductionmentioning
confidence: 99%