Commonality Analysis for Multiple Chain Integrity Failures

Abstract

The aim of this paper is to disclose an alternative FA approach to handle complex cases, showing multiple chain failures with multiple candidates. Starting from a commonality layout analysis of candidates resulting from the diagnosis, it is possible to identify a common interconnection shared between the several candidates, already at schematic level. The effectiveness of such analysis has been successfully verified by means of a photo-emission microscopy (PEM) analysis, while running scan chain patterns and by physical analysis.