Breakdown in low pressure Ne gas: mechanisms and statistical analysis of time delay

Abstract

The results of investigations of electrical breakdown mechanisms, and their influences on the time delay distributions are presented. The investigations are performed by analyzing the density distributions and probability plots of experimentally obtained time delay distributions for different relaxation times and overvoltages in gas tube filled with neon at 10 3 Pa (10 mbar). The time delay density distributions are fitted with Gaussian distributions for relaxation time smaller than 15 ms and exponential distributions for relaxation time greater than 150 ms, while in the region of relaxation time between 15ms and 150 ms with the Weibull distribution. Index Terms -Electrical breakdown, time delay density distributions, probability plots, electrical breakdown, neon. 202 Č. A. Maluckov and S. A. Mladenović: Breakdown in Low Pressure Ne Gas: Mechanisms and Statistical Analysis of Time Delay

Investigation of statistical behaviour of electrical breakdown voltage distribution for nitrogen‐filled diode at 13.3 mbar pressure

“…This type of distribution is designed to determine the probability of failure of components and systems after a certain period of use. The Weibull distribution is often used to describe breakdown phenomena, and the shape of distribution function that we used in this paper is …”