2019
DOI: 10.1109/tps.2019.2922822
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Experimental Study on Breakdown Time Delay of Hundreds of Nanoseconds Pulse Under Different du/dt for mm Gaps

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Cited by 9 publications
(4 citation statements)
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“…In the MV bipolar pulse generator for electromagnetic pulse (EMP) simulator [1], two primary pulses with hundrednanosecond rise time need compression and superposition, which requires low-jitter pulsed transfer switches [1,2]. To meet the requirement of the output waveform and obtain a high energy transfer efficiency, the switch should break down near the peak time of input pulses, which adds the difficulty of reducing the switch jitter due to a relatively small du/dt near the peak time [3]. The time jitters of laser-triggering and electrical-triggering switches can be reduced to 1-3 ns [4][5][6][7][8], but external sources are required.…”
Section: Introductionmentioning
confidence: 99%
“…In the MV bipolar pulse generator for electromagnetic pulse (EMP) simulator [1], two primary pulses with hundrednanosecond rise time need compression and superposition, which requires low-jitter pulsed transfer switches [1,2]. To meet the requirement of the output waveform and obtain a high energy transfer efficiency, the switch should break down near the peak time of input pulses, which adds the difficulty of reducing the switch jitter due to a relatively small du/dt near the peak time [3]. The time jitters of laser-triggering and electrical-triggering switches can be reduced to 1-3 ns [4][5][6][7][8], but external sources are required.…”
Section: Introductionmentioning
confidence: 99%
“…This phe- nomenon partly agrees well with the voltage-second characteristic in high voltage engineering [6], but back edge breakdown and no-breakdown cases occurred when du/dt was decreased to make the switch break down near the peak time. Because the peak electric field strength in the switch under different gas pressure was from 50kV/cm to 200kV/cm, only field emission current was insufficient to produce enough initial electrons, natural background radiation and field emission considering dielectric impurities on cathode surface might be main sources of initial electrons and statistical time delay jitter was a dominant part [18], [19]. Once the switch failed to break down before the peak time due to a long statistical time delay, then the voltage on the gap began to fall quickly and the electron avalanche process might be interrupted.…”
Section: A Self-breakdown and Voltage-second Characteristicsmentioning
confidence: 99%
“…Hegeler et al [11] studied the influence of electrode profile on the switching efficiency of a LTS with hemi spherical and flat electrodes, and reported that the flat electrode design exhibits an improved switching reliability i.e., low pre-fire probability and low σ d , as compared to hemi-spherical electrode profile. A reduction in t d and σ d can also be achieved through UV illumination of the discharge gap [12] and by applying a fast dV/dT trigger pulse [13]. Verma et al [14] experimentally studied the switching performance in j(SF 6 ): j(Ar) = 20:80 by applying a trigger pulse of slew rate ∼0.07 k V ns −1 , 6 kV ns −1 , and reported that by applying a trigger pulse with high dV/dT the t d and σ d were improved.…”
Section: Introductionmentioning
confidence: 99%