Directed self-assembly
(DSA) of block copolymers is one of the
most promising patterning techniques for patterning sub-10 nm features.
However, at such small feature sizes, it is becoming increasingly
difficult to fabricate the guiding pattern for the DSA process, and
it is necessary to explore alternative guiding methods for DSA to
achieve long-range ordered alignment. Here, we report the self-aligned
assembly of a triblock copolymer, poly(2-vinylpyridine)-b-polystyrene-b-poly(2-vinylpyridine) (P2VP-b-PS-b-P2VP) on neutral graphene nanoribbons
with the gap consisting of a P2VP-preferential silicon oxide (SiO2) substrate via solvent vapor annealing. The assembled P2VP-b-PS-b-P2VP
demonstrated long-range, one-dimensional alignment on the graphene
substrate in a direction perpendicular to the boundary of the graphene
and substrate with a half-pitch size of 8 nm, which greatly alleviates
the lithography resolution required for traditional chemoepitaxy DSA.
A wide processing window is demonstrated with the gap between graphene
stripes varying from 10 to 100 nm, overcoming the restriction on widths
of guiding patterns to have commensurate domain spacing. When the
gap was reduced to 10 nm, P2VP-b-PS-b-P2VP formed a straight-line pattern on both the graphene and the
substrate. Monte Carlo simulations showed that the self-aligned assembly
of the triblock copolymer on the graphene nanoribbons is guided at
the boundary of parallel and perpendicular lamellae on graphene and
SiO2, respectively. Simulations also indicate that the
swelling of a system allows for rapid rearrangement of chains and
quickly anneal any misaligned grains and defects. The effect of the
interaction strength between SiO2 and P2VP on the self-assembly
is systematically investigated in simulations.