Materials Research Society Symposium Proceedings 2008
DOI: 10.1557/proc-1112-e03-01
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Bosch Process – DRIE Success Story, New Applications and Products

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Cited by 4 publications
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“…The n+ regions were formed by thermal diffusion from the deposited PSG (phosphosilicate glass) films, and the p+ regions were formed by boron ion implantation. The PD arrays are formed by the Bosch process using deep reactive ion etching (Deep RIE) [32][33] [34]. Its trench width is 20 µm at the top of the chip and 15 µm at its bottom, and its silicon substrate thickness is 540 µm.…”
Section: A Sensor Chip Structurementioning
confidence: 99%
“…The n+ regions were formed by thermal diffusion from the deposited PSG (phosphosilicate glass) films, and the p+ regions were formed by boron ion implantation. The PD arrays are formed by the Bosch process using deep reactive ion etching (Deep RIE) [32][33] [34]. Its trench width is 20 µm at the top of the chip and 15 µm at its bottom, and its silicon substrate thickness is 540 µm.…”
Section: A Sensor Chip Structurementioning
confidence: 99%
“…A. 8,,0,,,,UX,UY,UZ,ROTZ,LOCAL,11,CART,0,0,0,0,0,CSYS,11 DK,8,ROTY, INFO,'t','w','R','E','arclength' ! Writes an output message via the ANSYS message subroutine %-8C %-8C %-8C %-8C %-8C !…”
Section: Bistabilitymentioning
confidence: 99%