2014
DOI: 10.1016/j.egypro.2014.08.050
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Boron Emitters from Doped PECVD Layers for n-type Crystalline Silicon Solar Cells with LCO

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Cited by 18 publications
(18 citation statements)
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“…These layers have doping as well as barrier properties. 6,[8][9][10] CVD as well as gas-phase grown doping layers as diffusion source have not been commonly used as passivation layers, and CVD SiO x doping layers have not yet been reported to reach the high level of passivation and optical transmission necessary for good cell performance directly after the diffusion process without further treatment. In addition, related investigations on passivation of B containing SiO x layers did not show sufficiently low j 0E values for B emitters (depending on sheet resistance) up to now.…”
mentioning
confidence: 99%
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“…These layers have doping as well as barrier properties. 6,[8][9][10] CVD as well as gas-phase grown doping layers as diffusion source have not been commonly used as passivation layers, and CVD SiO x doping layers have not yet been reported to reach the high level of passivation and optical transmission necessary for good cell performance directly after the diffusion process without further treatment. In addition, related investigations on passivation of B containing SiO x layers did not show sufficiently low j 0E values for B emitters (depending on sheet resistance) up to now.…”
mentioning
confidence: 99%
“…Aside from commonly used gasphase diffusions using BBr 3 2,3 or BCl 3 4 sources, chemical vapor deposited (CVD) doping layers can be used to form the necessary diffusion source. [5][6][7][8][9][10] Using plasma-enhanced chemical vapor deposited (PECVD) doping layers [5][6][7][8][9][10] reduces the number of solar cell process steps compared to gas phase based processes and increases the flexibility of future industrial process flows for advanced cell designs such as n-type passivated emitter rear totally diffused (PERT) or interdigitated back contact (IBC) solar cells. 10 Furthermore, PECVD doping layers allow for a larger parameter range of doping profiles because of the separation of doping source deposition and drive-in step.…”
mentioning
confidence: 99%
“…[68,69] During PECVD, electrons rapidly gain energy through a radio frequency (RF) field and, combined with a reagent gas (e.g. PH 3 ), they form highly reactive chemical species that produce the desired layer, already at a temperature of 300 °C.…”
Section: Chemical Vapor Depositionmentioning
confidence: 99%
“…Yet, the measurement can still provide useful information, especially when comparing different doping settings of the same technique, as the sheet resistance will decrease with increasing surface concentration. [63,68] Similar to ball grooving and staining, the combination of …”
Section: Flat Surfacesmentioning
confidence: 99%
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