BISD: Scan-based Built-In self-diagnosis

Elm,

doi:10.1109/date.2010.5456997

Cited by 14 publications

(8 citation statements)

References 35 publications

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“…For all other circuits, the overhead is negligible compared to that of the seed memory on the input side. For 4-pattern compaction the memory sizes are already in the order of magnitude of that in [8]. For eight pattern compaction the memory increase drops even below 10% for the larger circuits.…”

Section: B Bisd Hardware Overheadmentioning

confidence: 87%

“…More recently, a novel built-in self diagnosis (BISD) architecture was proposed in [8], requiring only a single test session and achieving high fault coverage and diagnosis resolution. The architecture, however, substantially differs from the STUMPS scheme and the high fault coverage and diagnostic resolution result from dedicated synthesis and ATPG methods.…”

Section: State Of the Artmentioning

confidence: 99%

“…The diagnosis methods proposed for this architecture are based on repeated test sessions, where the bandwidth necessary for the repetitions is not suitable for in-field scenarios and the test repetitions themselves already cause overhead in terms of test time [3], [4], [5], [6], [7]. The second diagnosis technique for random logic BIST relies on a dedicated hardware architecture [8]. While only one test session is necessary for the collection of diagnostic information, the architecture has the disadvantage, that it requires a dedicated hardware structure and its corresponding synthesis and test pattern generation (ATPG) processes.…”

Section: Introductionmentioning

confidence: 99%

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Structural In-Field Diagnosis for Random Logic Circuits

Cook

Elm

Wunderlich

et al. 2011

2011 Sixteenth IEEE European Test Symposium

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In-field diagnosability of electronic components in larger systems such as automobiles becomes a necessity for both customers and system integrators. Traditionally, functional diagnosis is applied during integration and in workshops for infield failures or break-downs. However, functional diagnosis does not yield sufficient coverage to allow for short repair times and fast reaction on systematic failures in the production. Structural diagnosis could yield the desired coverage, yet recent builtin architectures which could be reused in the field either do not reveal diagnostic information or necessitate dedicated test schemes.The paper at hand closes this gap with a new built-in test method for autonomous in-field testing and in-field diagnostic data collection. The proposed Built-In Self-Diagnosis method (BISD) is based on the standard BIST architecture and can seamlessly be integrated with recent, commercial DfT techniques. Experiments with industrial designs show that its overhead is marginal and its structural diagnostic capabilities are comparable to those of external diagnosis on high-end test equipment.

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Section: B Bisd Hardware Overheadmentioning

confidence: 87%

Section: State Of the Artmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Structural In-Field Diagnosis for Random Logic Circuits

Cook

Elm

Wunderlich

et al. 2011

2011 Sixteenth IEEE European Test Symposium

Self Cite

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“…In direct diagnosis, the fault location is identified directly from the faulty signature, without sorting out the values of each scan element [24]. However, this method still requires several test sessions and can only handle stuck-at faults or the techniques are incompatible with the STUMPS architecture [24], [25], [26].…”

Section: Built-in Diagnosismentioning

confidence: 99%

Diagnostic Test of Robust Circuits

Cook

Hellebrand

Indlekofer

et al. 2011

2011 Asian Test Symposium

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Robust circuits are able to tolerate certain faults, but also pose additional challenges for test and diagnosis. To improve yield, the test must distinguish between critical faults and such faults, that could be compensated during system operation; in addition, efficient diagnosis procedures are needed to support yield ramp-up in the case of critical faults. Previous work on circuits with time redundancy has shown that "signature rollback" can distinguish critical permanent faults from uncritical transient faults. The test is partitioned into shorter sessions, and a rollback is triggered immediately after a faulty session. If the repeated session shows the correct result, then a transient fault is assumed. The reference values for the sessions are represented in a very compact format. Storing only a few bits characterizing the MISR state over time can provide the same quality as storing the complete signature. In this work the signature rollback scheme is extended to an integrated test and diagnosis procedure. It is shown that a single test run with highly compacted reference data is sufficient to reach a comparable diagnostic resolution to that of a diagnostic session without any data compaction.

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“…Very efficient techniques are available for the extreme compaction of the circuit responses without compromising the diagnostic resolution [11,12].…”

Section: Introductionmentioning

confidence: 99%

Embedded Test for Highly Accurate Defect Localization

Mumtaz

Imhof

Holst

et al. 2011

2011 Asian Test Symposium

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Modern diagnosis algorithms are able to identify the defective circuit structure directly from existing fail data without being limited to any specialized fault models. Such algorithms however require test patterns with a high defect coverage, posing a major challenge particularly for embedded testing. In mixed-mode embedded test, a large amount of pseudorandom (PR) patterns are applied prior to deterministic test pattern. Partial Pseudo-Exhaustive Testing (P-PET) replaces these pseudo-random patterns during embedded testing by partial pseudo-exhaustive patterns to test a large portion of a circuit fault-model independently. The overall defect coverage is optimized compared to random testing or deterministic tests using the stuck-at fault model while maintaining a comparable hardware overhead and the same test application time. This work for the first time combines P-PET with a fault model independent diagnosis algorithm and shows that arbitrary defects can be diagnosed on average much more precisely than with standard embedded testing. The results are compared to random pattern testing and deterministic testing targeting stuck-at faults.

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BISD: Scan-based Built-In self-diagnosis

Cited by 14 publications

References 35 publications

Structural In-Field Diagnosis for Random Logic Circuits

Structural In-Field Diagnosis for Random Logic Circuits

Diagnostic Test of Robust Circuits

Embedded Test for Highly Accurate Defect Localization

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