Abstract:Modern diagnosis algorithms are able to identify the defective circuit structure directly from existing fail data without being limited to any specialized fault models. Such algorithms however require test patterns with a high defect coverage, posing a major challenge particularly for embedded testing. In mixed-mode embedded test, a large amount of pseudorandom (PR) patterns are applied prior to deterministic test pattern. Partial Pseudo-Exhaustive Testing (P-PET) replaces these pseudo-random patterns during e… Show more
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