2016
DOI: 10.1109/jeds.2016.2560879
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Bipolar Resistive Switching Behavior in Sol-Gel MgTiNiOxMemory Device

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Cited by 17 publications
(13 citation statements)
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“…In addition to this, interface effects, non‐uniformity in switching layer and a top electrode, different percolation paths and defects close to conductive filament are also responsible for the non‐uniformity in the HRS values . However, observed standard deviation and coefficient of variation of HRS are very small as compared to other inorganic and organic memory device reported in the literature . The better uniformity in the resistive switching leads to improved reliability and stability of the cycle to cycle and device to device operations.…”
Section: Resultsmentioning
confidence: 97%
“…In addition to this, interface effects, non‐uniformity in switching layer and a top electrode, different percolation paths and defects close to conductive filament are also responsible for the non‐uniformity in the HRS values . However, observed standard deviation and coefficient of variation of HRS are very small as compared to other inorganic and organic memory device reported in the literature . The better uniformity in the resistive switching leads to improved reliability and stability of the cycle to cycle and device to device operations.…”
Section: Resultsmentioning
confidence: 97%
“…Figure 9 b presents the retention capability of CoG 0.5, 1, and 2 M memory devices measured at room temperature and obtained at a voltage of 0.1 V. The ON/OFF ratio of the CoG memory device (1 M) remains higher than 10 5 . The smooth roughness may facilitate stable resistive switching [ 19 , 20 ], and an improved retention capability is also achieved.…”
Section: Resultsmentioning
confidence: 99%
“…In the high-voltage region of the HRS, the I – V slopes of the fitting line were approximately 2. The current density abruptly increases with I – V slopes greater than 2 when all the available traps are filled [ 6 , 7 ]. X-ray photoelectron spectroscopy (XPS) was used to analyze the TiO 2 thin films as presented in Figure 1 c. The peaks located at 529.5 and 531.1 eV were associated with lattice and non-lattice oxygen ions, respectively.…”
Section: Resultsmentioning
confidence: 99%