2018
DOI: 10.1103/physrevmaterials.2.103803
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Beyond thermodynamic defect models: A kinetic simulation of arsenic activation in CdTe

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Cited by 24 publications
(21 citation statements)
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“…The second (source) term in the RHS of Equation represents the net production rate R i (x,y,t) of i th species in all the elementary reactions. A detailed description of how this term is formulated could be found elsewhere …”
Section: Methodsmentioning
confidence: 99%
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“…The second (source) term in the RHS of Equation represents the net production rate R i (x,y,t) of i th species in all the elementary reactions. A detailed description of how this term is formulated could be found elsewhere …”
Section: Methodsmentioning
confidence: 99%
“…A detailed description of how this term is formulated could be found elsewhere. [10] The overall flux F of a mobile defect species is driven by the gradient of its electrochemical potential μ and is proportional to its concentration μ and diffusivity D:…”
Section: Governing Equationsmentioning
confidence: 99%
See 1 more Smart Citation
“…[3][4][5] The origin of this doping limit has not been established, but theoretical studies suggest that it may be caused by the formation of self-compensating AX center or defect complex. [3][4][5][6] The AX center is formed due to a large lattice relaxation of the substitutional dopant, which results in conversion to a donor state. 3,5 It was recently reported that in situ Asdoping in polycrystalline thin film CdTeSe PV devices achieved greater than 20% power conversion efficiency, but dopant activation remained low (2-4%).…”
Section: Introductionmentioning
confidence: 99%
“…Capacitance–voltage ( C–V ), dual-wavelength time-resolved photoluminescence (TRPL), and external quantum efficiency (EQE) were used to better understand this difference. Guided by a theoretical understanding developed in the literature, we attribute the poor performance in reconstructed CdSeTe:As devices to (i) insufficient doping in the MZO emitter, (ii) increased interface recombination, likely due to chemically driven defect formation (particularly compensating defects in CdSeTe:As) during MZO deposition, and (iii) a collapsed depletion region which greatly increases sensitivity to the front interface and exacerbates the impact of (i) and (ii). This highlights the importance of controlling front interface properties and defect chemistry in highly doped CdSeTe:As devices.…”
mentioning
confidence: 99%