2009
DOI: 10.1007/s10967-009-0229-x
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Benchmarking and analysis of 6Li neutron depth profiling of lithium ion cell electrodes

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Cited by 19 publications
(17 citation statements)
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“…Applications range from boron impurity determination in silicon to boron nitrogen ratios in coatings (Ziegler et al, 1972;Downing et al, 1993;Ünlü et al, 1999). Whitney et al (2009), first suggested using the 6 Li capture reaction for NDP on lithium ion battery systems. The technique offers the unique ability to quantitatively measure lithium concentrations, as function of depth, independent of oxidation state, during battery cycling (Oudenhoven et al, 2011;Wang et al, 2014;Harks et al, 2015;Liu and Co, 2016).…”
Section: Introductionmentioning
confidence: 99%
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“…Applications range from boron impurity determination in silicon to boron nitrogen ratios in coatings (Ziegler et al, 1972;Downing et al, 1993;Ünlü et al, 1999). Whitney et al (2009), first suggested using the 6 Li capture reaction for NDP on lithium ion battery systems. The technique offers the unique ability to quantitatively measure lithium concentrations, as function of depth, independent of oxidation state, during battery cycling (Oudenhoven et al, 2011;Wang et al, 2014;Harks et al, 2015;Liu and Co, 2016).…”
Section: Introductionmentioning
confidence: 99%
“…Hence it measures 6 Li atoms only, regardless of their oxidation state, ensuring selectivity and low noise. The capture reaction is initiated by the absorption of a thermal neutron resulting in two charged particles with a well-defined energy: (Ziegler et al, 1972;Whitney et al, 2009). 6 Li + n thermal yields −→ 3 H + 2727.88 keV + He 2+ (2055.12 keV) White beam thermal neutron fluxes at the Reactor Institute in Delft are in the order of 10 7 neutrons/ cm 2 /s at the NDP the sample position.…”
Section: Introductionmentioning
confidence: 99%
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“…The depth profiles of the isotopes can be determined by measuring the residual energies of the charged particles or the recoil atoms. The NDP technique has become an important method to measure the depth profiles of light elements such as lithium and boron in lithium battery and semiconductor materials [2][3][4].…”
Section: Introductionmentioning
confidence: 99%