2006
DOI: 10.1049/el:20060156
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Behaviour of electrical and optical properties of indium tin oxide transparent electrode after CMP process

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Cited by 11 publications
(1 citation statement)
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“…The higher sheet resistance was thought to lower carrier concentration. Carrier concentration would be attributed to oxygen vacancies, such as the main carriers in films based on an oxide complex [23,24]. The oxygen vacancies would be lower due to the chemical reactions with the slurry in the CMP process.…”
Section: Resultsmentioning
confidence: 99%
“…The higher sheet resistance was thought to lower carrier concentration. Carrier concentration would be attributed to oxygen vacancies, such as the main carriers in films based on an oxide complex [23,24]. The oxygen vacancies would be lower due to the chemical reactions with the slurry in the CMP process.…”
Section: Resultsmentioning
confidence: 99%