2002
DOI: 10.1143/jjap.41.1354
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Bandgap Effects of Quantum Well Active-Layer on Threshold Current Density, Differential Gain and Temperature Characteristics of 1.3 µm InGaAlAs/InP Quantum Well Lasers

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Cited by 4 publications
(4 citation statements)
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“…Growth was initiated by heating an InP:S substrate wafer in PH 3 to the growth temperature, growing a 0.2 µm InP:Si buffer layer, then depositing an AlInGaAs layer or heterostructure. The substrate orientation was either exact (100), or vicinal, with a misorientation of 2-6 o toward <111>A.…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…Growth was initiated by heating an InP:S substrate wafer in PH 3 to the growth temperature, growing a 0.2 µm InP:Si buffer layer, then depositing an AlInGaAs layer or heterostructure. The substrate orientation was either exact (100), or vicinal, with a misorientation of 2-6 o toward <111>A.…”
Section: Methodsmentioning
confidence: 99%
“…This is attributed to improved carrier confinement resulting from a higher conduction band offset [1][2][3][4][5][6][7][8][9][10]. It has also been observed that the ratio of radiative to non-radiative recombination is also higher in the AlInGaAs system [5].…”
Section: Introductionmentioning
confidence: 99%
“…A compressive well with tensile barrier has been theoretically [10,18,19,27,28] and experimentally [22,29,30] shown to achieve high gain, differential gain and a large modulation bandwidth. A 0.88% compressive strain In 0.75 Ga 0.25 As 0.81 P 0.19 well and In 0.41 Ga 1−y Al y As 0.83% tensile strained barrier are considered in this study.…”
Section: Single Quantum Well Materials Gainmentioning
confidence: 99%
“…In quaternary materials, the amount of strain and the bandgap can be independently determined. Many material combinations can therefore be used as an active layer, and many researchers have consequently tried to optimize the InGaAsP and InGaAlAs QW structures (Thijs et al 1994;Park et al 1998;Bae et al 2002).…”
Section: Introductionmentioning
confidence: 99%