2002
DOI: 10.1103/physrevb.66.121308
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Band bending and photoemission-induced surface photovoltages on cleann- andp-GaN (0001) surfaces

Abstract: Photoelectron spectroscopy ͑PES͒ has been used to measure the dependence of core-level shifts on temperature T and source intensity for the clean ͑0001͒ surfaces of p-and n-GaN grown by metalorganic chemical vapor deposition. In the dark, the Fermi level at the surface occurs 2.55 eV above the valence band maximum for both carrier types. The surface photovoltage ͑SPV͒ induced by laboratory PES sources exceeds 1 eV on p-GaN at room temperature ͑RT͒. Hence PES at RT may prove impractical for determining Schottky… Show more

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Cited by 118 publications
(90 citation statements)
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References 25 publications
(21 reference statements)
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“…As commented before, when the surface depleted area is larger than the NW radius no neutral region exists in the wire core, and the surface band bending is effectively reduced. Based on would imply an opposite V CPD change, namely a decrease for the p-type NW and an increase for the n-type NW [19,28], contrary to our observations. Alternatively, the shift in VCPD induced by UV illumination could be accounted for by considering the Schottky nature of the NW/HOPG contact.…”
Section: Resultscontrasting
confidence: 57%
See 1 more Smart Citation
“…As commented before, when the surface depleted area is larger than the NW radius no neutral region exists in the wire core, and the surface band bending is effectively reduced. Based on would imply an opposite V CPD change, namely a decrease for the p-type NW and an increase for the n-type NW [19,28], contrary to our observations. Alternatively, the shift in VCPD induced by UV illumination could be accounted for by considering the Schottky nature of the NW/HOPG contact.…”
Section: Resultscontrasting
confidence: 57%
“…Only in the absence of surface band bending the difference VCPD between the n and p sides would correspond to the built-in potential, which for large doping is expected to be of the order of the band gap. Indeed, due to the presence of surface states and the associated band bending an upward surface band bending is expected at the m-plane surface of the n-type side [18], while for p-type GaN the band bending is expected to be downwards, as shown by Long et al for c-plane GaN [19]. As a result, the measured V CPD gives a lower limit to the junction built-in potential.…”
Section: Resultsmentioning
confidence: 87%
“…2,[16][17][18] Band dispersion has also been investigated using photoemission. [19][20][21][22][23][24][25] Long et al 16 used photoelectron (PES) and X-ray photoemission spectroscopy (XPS) on the clean GaN(0001) surface. In the limit of low temperature and low doping concentration, E F −E v was measured to be about 2.7 eV on the surface of n-type GaN, and about 1.3 eV on the surface of p-type GaN.…”
Section: Survey Of Experimental Resultsmentioning
confidence: 99%
“…The spatial distribution of the SPV-induced charge carriers in the band-bending potential opposes the original charge distribution that gave rise to the band bending. In this way, these photoinduced charges cancel the original electrostatic potential and thus lead to a decrease in the band bending [46][47][48][49][50][51]. Insight into the delicate synergy of SPV effects and photostimulated desorption of foreign species from the sample surface will be given in Sec.…”
Section: A Bi 2 Sementioning
confidence: 99%