2022
DOI: 10.1140/epjp/s13360-022-02894-2
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Band alignment determination in few-layer exfoliated MoSe2/SiO2 interface using Synchrotron-based photoemission spectroscopy

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“…SiNWs from p-Si (100) wafer was fabricated by MACE as shown in the schematic (figure 1). Figures 3(a Further, TEM analysis of exfoliated MoSe 2 suggest the formation of a flakes-like structure having crystalline behavior over the entire surface (shown in supplementary figure S2) [32,37].…”
Section: Resultsmentioning
confidence: 99%
“…SiNWs from p-Si (100) wafer was fabricated by MACE as shown in the schematic (figure 1). Figures 3(a Further, TEM analysis of exfoliated MoSe 2 suggest the formation of a flakes-like structure having crystalline behavior over the entire surface (shown in supplementary figure S2) [32,37].…”
Section: Resultsmentioning
confidence: 99%