Backscatter in integrated optical waveguides and circuits

Canciamilla, A.; Torreggiani, Matteo; Ferrari, C.; Morichetti, Francesco; Costa, R.; Melloni, Andrea

doi:10.1117/12.809895

Cited by 5 publications

(4 citation statements)

References 11 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Note also that the multiple round trips in the RR strongly correlate the backscattering, so that the cavity-enhanced backscattering does not exhibit a white-noise-like PSD. 12 Off-resonance, the effect of the RR disappears and the backscattering of the bus waveguide emerges.…”

mentioning

confidence: 98%

“…Its frequency domain response shows an almost white-noise-like PSD, even though some degree of correlation is provided by the finite length of the waveguide. 12 Figure 2 ͓͑b 1 ͒ and ͑c 1 ͔͒ shows the transfer function of SOI APFs with K = 0.75 and K = 0.2. As is well known, as K decreases, light trapping at the resonant frequencies of the RR can induce sharp transmission notches.…”

mentioning

confidence: 99%

See 1 more Smart Citation

Coherent backscattering in optical microring resonators

Morichetti

Canciamilla

Martinelli

et al. 2010

Applied Physics Letters

View full text Add to dashboard Cite

The effects of backscattering induced by waveguide sidewall roughness in integrated ring resonators (RRs) are experimentally observed. We demonstrate that coherent backscattering, originated by multiple round trips in the RR, increases with the square of the effective group index of the cavity and can dramatically affect the behavior of integrated RRs even at moderate quality factors of 10^4. From our results backscattering emerges as one of the most severe limiting factors on the performance of RRs fabricated with state-of-the-art silicon-on-insulator nanowaveguides

show abstract

mentioning

confidence: 98%

mentioning

confidence: 99%

Coherent backscattering in optical microring resonators

Morichetti

Canciamilla

Martinelli

et al. 2010

Applied Physics Letters

View full text Add to dashboard Cite

show abstract

“…4. They include (back)reflections at discontinuities [55], [56], distributed scattering at roughness, unintended coupling to adjacent components and excessive absorption and stray light propagating in cladding modes or the substrate. In addition, optical nonlinearities can be considered as parasitics, as devices models might not take into account local high intensities within a building block.…”

Section: Challenge: Parasiticsmentioning

confidence: 99%

Design Challenges in Silicon Photonics

Bogaerts

Fiers

Dumon

2014

IEEE J. Select. Topics Quantum Electron.

127

View full text Add to dashboard Cite

Silicon photonics is rapidly gaining maturity in highbandwidth optical communication, with applications in datacom, access networks, and I/O for bandwidth-intensive electronics. Also, applications are emerging in spectroscopy and sensing. To get the best performance out of the photonics, co-integration with electronics is needed: side-by-side, stacked, or on the same chip. However, the combination of photonics and electronics introduces a range of new problems on the design side: Codesign and cosimulation of complex photonic and electronic circuits, tolerance to variability, and verification algorithms that can handle photonic circuits. We will discuss these challenges and give an outlook on how tools need to evolve to address the needs of photonic-electronic IC designers.

show abstract

“…Therefore it is a crucial point, for the development of high Δn technology, to be able to measure and quantitatively predict their effects over the device performances, in order to taking them into account in design process for simple components as waveguides, for complex devices as resonators or filters and, especially, for large circuits. process 10 and its statistics 11 and by providing experimental evidence that backscattered power can reach surprisingly high levels in sub-wavelength silicon waveguides 12 , especially if enhanced by resonant structures 13 .…”

Section: Introductionmentioning

confidence: 99%

Backscattering in silicon photonic waveguides and circuits

et al. 2011

View full text Add to dashboard Cite

The effects of roughness induced backscattering in optical waveguides and circuit realized on a silicon-on-insulator platform are investigated. A systematic experimental investigation on low-loss silicon nanowires, with a sidewall roughness rms around 1-2 nm, is presented, showing that a few hundreds of micrometers long waveguide exhibits a backscattering level that can hinder its exploitation in many applications. The effect is typically stronger for TE polarization and is significantly enhanced inside optical cavities, such as microring resonators, where backscattering is coherently enhanced according to the square of the finesse of the resonator and can modify dramatically the spectral response of the resonators, even at moderate quality factors. We found general relationships relating backscattering to the geometric and optical parameters of the waveguides, to polarization rotation effects, and to coupling with higher-order modes. On the basis of these results, design rules to mitigate backscattering effects are proposed. The main statistical properties of roughness induced backscattering were also experimentally derived, these results enabling an accurate modeling of realistic waveguides and the evaluation of the backscattering impact in integrated devices and circuits

show abstract

Backscatter in integrated optical waveguides and circuits

Cited by 5 publications

References 11 publications

Coherent backscattering in optical microring resonators

Coherent backscattering in optical microring resonators

Design Challenges in Silicon Photonics

Backscattering in silicon photonic waveguides and circuits

Contact Info

Product

Resources

About