1994
DOI: 10.1364/ao.33.001213
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Azimuthal alignments in ellipsometry: a high-precision method using a polarization modulator

Abstract: An original (to the best of our knowledge) method to achieve azimuthal alignments of all polarizing components in ellipsometry is presented. It is an accurate nulling method, and it is easy to implement and can be used with any isotropic reflecting layer. It also allows one to check the eventual presence of surface anisotropy. The ferrofluid modulator used in this setup is briefly described. Measurements made for three reflecting surfaces (fused silica, silicon, and germanium) are presented.

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Cited by 7 publications
(5 citation statements)
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“…Birefringence. The birefringence measurements, performed by using the null ellipsometry principle [20], are taken over from paper [21]. The samples analyzed were DOS-based samples 6 and 9.…”
Section: Samplesmentioning
confidence: 99%
“…Birefringence. The birefringence measurements, performed by using the null ellipsometry principle [20], are taken over from paper [21]. The samples analyzed were DOS-based samples 6 and 9.…”
Section: Samplesmentioning
confidence: 99%
“…Expanding cosδ i and sinδ i (i = 1, 2) into series in Bessel functions as (10) (11) and substituting these expressions into Eq. (9), we can represent the measured signal intensity I(t) as a sum of the constant and variable components.…”
Section: Spectropolarimeter Designmentioning
confidence: 99%
“…In the case where the phase shift δ in modulator M 1 varies with time according to the harmonic law (8), let us expand (similar to the case of two modulators considered above) cosδ i and sinδ i (i = 1, 2) into series using formulas (10) and (11) and set the modulation index δ 0 = 2.404 rad. Restricting the expansion to the principal terms, we obtain the following expression for the intensity (in I 0 units):…”
Section: Frequencymentioning
confidence: 99%
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