Field records for small source-receiver offsets often contain intensive converted PS-waves that cannot be generated in laterally homogeneous isotropic models. Among the most likely physical reasons for this converted energy is the presence of anisotropy on either side of the reflector. Here, we study the small-angle reflection coefficients of the split converted PS 1-and PS 2-waves (R P S1 and R P S2) for a horizontal interface separating two transversely isotropic media with arbitrary orientations of the symmetry axis. The normal-incidence reflection coefficients R P S1 (0) and R P S2 (0) vanish when both halfspaces have a horizontal symmetry plane, which happens if the symmetry axis is vertical or horizontal (i.e., if the medium is VTI or HTI). For a tilted symmetry axis in either medium, however, the magnitude of the reflection coefficients can reach substantial values close to 0.1, even if the strength of anisotropy is moderate. To study the influence of the orientation of the symmetry axis and the anisotropy parameters, we develop concise weak-contrast, weak-anisotropy approximations for the reflection coefficients and compare them with exact numerical results. In particular, the analytic solutions show that the contributions of the Thomsen parameters and δ to the coefficients R P S1 (0) and R P S2 (0) are governed by simple functions of the symmetry-axis tilt ν, which have the same form for both halfspaces. If the symmetry-axis orientation and anisotropy parameters do not change across the interface, the normal-incidence reflection coefficients are insignificant, regardless of the strength of the velocity and density contrast. The AVO (amplitude variation with offset) gradients of the PS-waves are mostly influenced by the anisotropy of the incidence medium that causes shear-wave splitting and determines the partitioning of energy between the PS 1 and PS 2 modes. Because of their substantial amplitude, small-angle PS reflections in TI media contain valuable information for anisotropic AVO inversion of multicomponent data. Our analytic solutions provide a foundation for linear AVO-inversion algorithms and can be used to guide nonlinear inversion based on the exact reflection coefficients.