Automated crystal lattice orientation mapping using a computer-controlled SEM

Schwarzer, Robert

doi:10.1016/s0968-4328(97)00010-3

Cited by 129 publications

(72 citation statements)

References 22 publications

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“…For optical applications, the properties of (001)-oriented diamond films are superior to those of (111)-oriented films in terms of the refractive index and extinction coefficient [11]. Beyond these basic texture-property relations [17], more specific studies on the relationship between texture and microstructure have been reported for diamond [15][16][17][18][19][20][21][22][23][24][25][26][27][28][29][30][31].…”

Section: Introductionmentioning

confidence: 99%

“…In particular, a more comprehensive understanding of the growth dynamics of diamond films with respect to texture and grain size evolution has not yet been obtained. Although important texture results for diamond have been obtained by x-ray diffraction (XRD), electron backscatter diffraction (EBSD) provides more detailed information about the texture, grain size, and interfaces of such films [18][19][20][21][22]26]. For instance, an important contribution in this area was made by Fujii et al [23].…”

Section: Introductionmentioning

confidence: 99%

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A 3D tomographic EBSD analysis of a CVD diamond thin film

Liu

Raabe

Zaefferer

2008

Science and Technology of Advanced Materials

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We have studied the nucleation and growth processes in a chemical vapor deposition (CVD) diamond film using a tomographic electron backscattering diffraction method (3D EBSD). The approach is based on the combination of a focused ion beam (FIB) unit for serial sectioning in conjunction with high-resolution EBSD. Individual diamond grains were investigated in 3-dimensions particularly with regard to the role of twinning.

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Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

A 3D tomographic EBSD analysis of a CVD diamond thin film

Liu

Raabe

Zaefferer

2008

Science and Technology of Advanced Materials

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“…Diffraction imaging with high-energy synchrotron radiation must be compared with location scanning of electron diffraction (Adams et al, 1994;Schwarzer, 1997). Both these techniques are complementary to each other in different respects.…”

Section: Discussionmentioning

confidence: 99%

“…This can be done by location-resolved diffraction methods. Among these, the EBSD-technique (Electron Back Scattering Diagrams) with automated location scanning is well known (e.g., the OIM (Adams et al, 1994) or ACOM (Schwarzer, 1997) technique). Because of the low pentration depth of electrons in materials, this technique ''sees'', however, only a very thin layer of the material.…”

Section: Introductionmentioning

confidence: 99%

High‐Resolution Imaging of Texture and Microstructure by the Moving Detector Method

Bunge

Klein

Wcislak

et al. 2003

Texture, Stress, and Microstructure

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In order to describe texture and microstructure of a polycrystalline material completely, crystal orientation g ¼ {' 1 È ' 2 } must be known in all points x ¼ {x 1 x 2 x 3 } of the material. This can be achieved by locationresolved diffraction of high-energy, i.e. short-wave, X-rays from synchrotron sources. Highest resolution in the orientation-as well as the location-coordinates can be achieved by three variants of a detector ''sweeping'' technique in which an area detector is continuously moved during exposure. This technique results in two-dimensionally continuous images which are sections and projections of the six-dimensional ''orientation-location'' space. Further evaluation of these images depends on whether individual grains are resolved in them or not. Because of the high penetration depth of high-energy synchrotron radiation in matter, this technique is also, and particularly, suitable for the investigation of the interior of big samples.

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“…The lattice rotations that occurred along the specimen gauge length during creep deformation were calculated using electron back scatter diffraction patterns (EBSP) [5,6]. Small bars of 3 x 4 mm* cross-section were machined along the axial direction of the specimen gauge length.…”

Section: Methodsmentioning

confidence: 99%

Modelling the Anisotropic and Biaxial Creep Behaviour of Ni-Base Single Crystal Superalloys CMSX-4 and SRR99 at 1223K

MacLachlan¹,

Wright²,

Gunturi³

et al. 2000

Superalloys 2000 (Ninth International Symposium)

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The use of single crystal turbine blade components has made many traditional models for creep unsuitable for application in certain loading situations. Such models generally assume deformation is isotropic. Since the introduction of single crystal components a generation of crystal plasticity or slip system models has emerged. Amongst the challenges of such models is to explain the orientation dependence of uniaxial creep behaviour and to attempt to make correlation between uniaxial and multiaxial stress states so that confidence can be'gained as to the performance of a model when it is applied to complex loading conditions. In this paper an attempt is made to address these issues. A slip system based finite element creep model has been fitted to uniaxial data at 1223 K in a range of crystallographic orientations. Based on experimental evidence the operative slip systems incorporated are the {111}<101> and {111}412> families of slip system. Analysis of the data and a consideration of the dislocation mechanisms likely to occur suggest that the significant component of the hardening matrix is latent hardening by the {111}<101> systems on the { 11 1}<112> systems, although hardening between the { 11 l} systems may also occur. The model can describe creep deformation as a function of orientation to a reasonable degree of accuracy. It is also shown to have reasonable predictive capability when used to analyse the results of thin cylinder biaxial creep tests on CMSX-4 and SRR99. The reason for this success is explained in terms of activated slip systems and the magnitude of the cumulative shear strain rate on different types of slip system as a function of orientation and stress state.Superanoys zoo0 @ited by

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Automated crystal lattice orientation mapping using a computer-controlled SEM

Cited by 129 publications

References 22 publications

A 3D tomographic EBSD analysis of a CVD diamond thin film

A 3D tomographic EBSD analysis of a CVD diamond thin film

High‐Resolution Imaging of Texture and Microstructure by the Moving Detector Method

Modelling the Anisotropic and Biaxial Creep Behaviour of Ni-Base Single Crystal Superalloys CMSX-4 and SRR99 at 1223K

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