Reflection, Scattering, and Diffraction From Surfaces VII 2020
DOI: 10.1117/12.2568050
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Augmenting CASI® BRDF measurement device to measure out-of-plane scatter with CCD pixel array

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Cited by 5 publications
(19 citation statements)
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“…The data collection set-up is described fully in Small's SPIE conference paper. 17,18 Overall, the relative uncertainty present in data collected via the modified Complete Angle Scatter Instrument (CASI) system was between 4% and 17%, with the highest uncertainty being present in the more diffuse samples due to the neutral density filter uncertainty, which affects the CCD uniformly. 19 The beam signature was a Helium-Neon laser source passing directly to the CCD detector.…”
Section: Simulated Data/beam Signature Datamentioning
confidence: 99%
“…The data collection set-up is described fully in Small's SPIE conference paper. 17,18 Overall, the relative uncertainty present in data collected via the modified Complete Angle Scatter Instrument (CASI) system was between 4% and 17%, with the highest uncertainty being present in the more diffuse samples due to the neutral density filter uncertainty, which affects the CCD uniformly. 19 The beam signature was a Helium-Neon laser source passing directly to the CCD detector.…”
Section: Simulated Data/beam Signature Datamentioning
confidence: 99%
“…The quantity δΦ i is the total incident flux on a small material surface area; δΦ s is the scattered flux measured by a small detector area, which subtends the solid angle δΩ d ; and θ s is the zenith angle between the material surface normal and the scattered direction. 4 For now, a single wavelength λ will be assumed, although f r , δΦ s , and δΦ i can all depend on wavelength as well. The δ symbols (denoting smallness of detector and sample illumination spot sizes) will be dropped for the rest of this work for clarity.…”
Section: Introductionmentioning
confidence: 99%
“…5 Augmenting the CASI ® with a charge-coupled device (CCD) pixel array provides the ability to simultaneously measure scatter directions outside the plane of incidence (out-of-plane) with high spatial resolution, particularly surrounding specular peaks. 4,6 The original uncertainty analysis for the CASI ®3 was built upon identifying uncertainties in various system parameters, and then quantifying how changes from nominal parameter values affect the overall BRDF calculation in Eq. (1).…”
Section: Introductionmentioning
confidence: 99%
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