Auger spectroscopy of surface layers in ferroelectrics

Comparison of surface and bulk room temperature domain structure of barium titanate ceramics using x-ray diffraction

“…Auger spectroscopy of the surface-layers in BaTi03 crystals and films was successfully tried by Tomashpolski et al [25,26] who confirmed the differences between the surface-layer and the bulk. They also studied the composition profiles of BaTi03 in relation to the processing temperature and substrate type.…”

Thickness-Dependent Electrical Properties of Pb(Zr, Ti)O[sub 3] Thin Film Capacitors for Memory Device Applications

“…Several attempts have been made to find the thickness dependence of ferroelectric thin film properties. [6][7][8][9] It has been observed that the dielectric constant and the polarization decrease and the coercive field increases with decreasing thickness. The effect of an interfacial layer of low dielectric permittivity and small grain size was invoked to explain the results.…”

“…The effect of an interfacial layer of low dielectric permittivity and small grain size was invoked to explain the results. [6][7][8][9] Also, a number of reports discussed the conduction mechanism in PZT thin films. Moazzami et al 10 reported a single carrier conduction mechanism.…”