“…Figure 10 depicts characterization tools with different technological basis. Essential characterization approaches for semiconductor nanomaterials are summarized in Table 3 [ 96 , 97 , 98 , 99 , 100 , 101 , 102 , 103 , 104 , 105 , 106 , 107 , 108 , 109 , 110 , 111 , 112 , 113 , 114 , 115 , 116 , 117 , 118 ].…”