Microscopy Methods in Nanomaterials Characterization 2017
DOI: 10.1016/b978-0-323-46141-2.00011-0
|View full text |Cite
|
Sign up to set email alerts
|

Auger Electron Spectroscopy

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
8
0

Year Published

2018
2018
2023
2023

Publication Types

Select...
6
1

Relationship

0
7

Authors

Journals

citations
Cited by 10 publications
(8 citation statements)
references
References 30 publications
0
8
0
Order By: Relevance
“…It can also happen that a second electron is ejected to remove excess energy. This electron is called the Auger electron [19]. The photoelectric effect strongly depends on Z, having dominance preferably in elements with high Z and with low energy photons.…”
Section: Photoelectric Effectmentioning
confidence: 99%
“…It can also happen that a second electron is ejected to remove excess energy. This electron is called the Auger electron [19]. The photoelectric effect strongly depends on Z, having dominance preferably in elements with high Z and with low energy photons.…”
Section: Photoelectric Effectmentioning
confidence: 99%
“…Figure 10 depicts characterization tools with different technological basis. Essential characterization approaches for semiconductor nanomaterials are summarized in Table 3 [ 96 , 97 , 98 , 99 , 100 , 101 , 102 , 103 , 104 , 105 , 106 , 107 , 108 , 109 , 110 , 111 , 112 , 113 , 114 , 115 , 116 , 117 , 118 ].…”
Section: Characterization Techniquesmentioning
confidence: 99%
“…For K shell vacancies, the Auger yield decreases with atomic number (Z), and for Z = 30 (zinc) the probabilities of the emission of X rays from the innermost shell and of the emission of Auger electrons is about equal. 18 When Compton scattering occurs, the electron is spread away together with a new photon that has a lower energy than the incoming one. Highly energetic photons (E > 1.02 MeV) produce an electron‐positron pair.…”
Section: Interaction Of Photons With Mattermentioning
confidence: 99%
“…The vacancy created in the inner layer is filled by an electron from an outer layer, the energy being released in the form of a fluorescence X‐ray photon or an Auger electron. For K shell vacancies, the Auger yield decreases with atomic number (Z), and for Z = 30 (zinc) the probabilities of the emission of X rays from the innermost shell and of the emission of Auger electrons is about equal 18 . When Compton scattering occurs, the electron is spread away together with a new photon that has a lower energy than the incoming one.…”
Section: Interaction Of Photons With Mattermentioning
confidence: 99%