Au Diffusion in Polycrystalline CdTe Thin Films

Influence of Au diffusion on structural, electrical and optical characteristics of CdTe thin films

“…As is seen from this expression, the Au diffusion in CdTe films is characterized by relatively low activation energy (0.54 eV). This value of activation energy for Au diffusion is lower than that (0.95 eV) and the diffusion coefficients are higher than those (6.6 × 10 −15 -3 × 10 −13 cm 2 s −1 in the range 400-550 • C) obtained for Au diffusion in polycrystalline CdTe films [7]. Di Lalla et al [7] investigated the Au diffusion, using RBS from analysis, for the Au concentration profiles in thin near-surface region (up to 120 nm) of CdTe films.…”

“…This value of activation energy for Au diffusion is lower than that (0.95 eV) and the diffusion coefficients are higher than those (6.6 × 10 −15 -3 × 10 −13 cm 2 s −1 in the range 400-550 • C) obtained for Au diffusion in polycrystalline CdTe films [7]. Di Lalla et al [7] investigated the Au diffusion, using RBS from analysis, for the Au concentration profiles in thin near-surface region (up to 120 nm) of CdTe films. Data on the grain sizes of crystallites in CdTe films in [7] were not presented.…”

“…Di Lalla et al [7] investigated the Au diffusion, using RBS from analysis, for the Au concentration profiles in thin near-surface region (up to 120 nm) of CdTe films. Data on the grain sizes of crystallites in CdTe films in [7] were not presented. Such a difference in the values of activation energy and Au diffusion coefficients obtained in [7] and the present work can be related to the determination of the diffusion coefficient from the concentration profiles for shallow depths (x = 0-120 nm) [7] and larger depths (x = 0-5 µm) in this work.…”

“…Data on the grain sizes of crystallites in CdTe films in [7] were not presented. Such a difference in the values of activation energy and Au diffusion coefficients obtained in [7] and the present work can be related to the determination of the diffusion coefficient from the concentration profiles for shallow depths (x = 0-120 nm) [7] and larger depths (x = 0-5 µm) in this work. The diffusion coefficient, defined from the analysis of the concentration profile of Au for shallow depths, is mainly a characteristic for Au penetration into grains.…”

“…The effect of the thermal annealing and the surface treatment on the change in the electrical characteristics of Au/nCdTe Schottky barriers prepared on the base of CdTe single crystal substrates has been reported [5,6]. To our knowledge, data on the Au diffusion in the CdTe films has been presented only in one work [7]. In this study, Au diffusion in polycrystalline CdTe films, prepared by electrodeposition, was investigated using the RBS technique.…”